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Synchrotron radiation-induced X-ray microanalysis”. Janssens K, Vincze L, Adams F, Jones KW, Analytica chimica acta 283, 98 (1993). http://doi.org/10.1016/0003-2670(93)85213-4
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Surface microanalysis”. Adams F, Adriaens A, Berghmans P, Janssens K, Analytica chimica acta 283, 19 (1993). http://doi.org/10.1016/0003-2670(93)85207-Z
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X-ray optics for synchrotron-radiation-induced X-ray micro fluorescence at the european synchrotron-radiation facility, Grenoble”. Vincze L, Janssens K, Adams F, Institute of physics conference series , 613 (1993)
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Prediction of the optical characteristics and analytical qualities of an X-ray fluorescence microprobe at the European Synchrotron Radiation Facility (Grenoble)”. van Langevelde F, Janssens KH, Adams FC, Vis RD, Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment 317, 383 (1992). http://doi.org/10.1016/0168-9002(92)90632-E
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Spectrum evaluation”. van Espen P, Janssens K (1992).
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens KH, Adams FC, van Langevelde F, Vis RD, Jones KW, Rivers M, Sutton S, Advances in X-ray analysis 35, 1265 (1992)
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens K, van Langevelde F, Adams F, Vis R, Sutton S, Rivers M, Jones K, Bowen D, (1992)
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Analysis of individual microscopic particles by means of synchrotron radiation induced X-ray micro fluorescence”. Janssens K, Adams F, Rivers ML, Jones KW, Proceedings 27th MAS (1992)
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The elemental composition of airborne particulate matter in the Atacama desert, Chile”. Rojas CM, Figueroa L, Janssens KH, Van Espen PE, Adams FC, Van Grieken RE, The science of the total environment 91, 251 (1990). http://doi.org/10.1016/0048-9697(90)90302-B
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Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles”. Storms HM, Janssens KH, Török SB, Van Grieken RE, X-ray spectrometry 18, 45 (1989). http://doi.org/10.1002/XRS.1300180203
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Increased accuracy in the automated interpretation of large epma data sets by the use of an expert system”. Janssens K, Vanborm W, van Espen P, Journal of research of the National Bureau of Standards (1934) 93, 260 (1988). http://doi.org/10.6028/JRES.093.037
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A general-purpose interface between fortran and the low-level functions of the ibm-pc”. Janssens K, van Espen P, Trends in analytical chemistry 7, 128 (1988). http://doi.org/10.1016/0165-9936(88)87009-2
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PC-MCA : a software package for the acquisition and processing of spectral data”. Janssens K, Nobels J, van Espen P, Chemometrics and intelligent laboratory systems 3, 335 (1988). http://doi.org/10.1016/0169-7439(88)80033-9
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The development process of an expert system for the automated interpretation of large epma data sets”. Janssens K, Dorrine W, van Espen P, Chemometrics and intelligent laboratory systems 4, 147 (1988). http://doi.org/10.1016/0169-7439(88)80086-8
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AXIL-PC, software for the analysis of complex-x-ray spectra”. van Espen P, Janssens K, Nobels J, Chemometrics and intelligent laboratory systems 1, 109 (1986). http://doi.org/10.1016/0169-7439(86)80031-4
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Evaluation of energy-dispersive x-ray-spectra with the aid of expert systems”. Janssens K, van Espen P, Analytica chimica acta 191, 169 (1986). http://doi.org/10.1016/S0003-2670(00)86306-0
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Implementation of an expert system for the qualitative interpretation of x-ray-fluorescence spectra”. Janssens K, van Espen P, Analytica chimica acta 184, 117 (1986). http://doi.org/10.1016/S0003-2670(00)86475-2
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