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| Author | Vincze, L.; Vekemans, B.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F. | ||||
| Title | Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging | Type | A1 Journal article | ||
Year  |
2004 | Publication | Analytical chemistry | Abbreviated Journal | |
| Volume | 76 | Issue | 22 | Pages | 6786-6791 |
| Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000225076400034 | Publication Date | 2004-11-12 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0003-2700; 5206-882x | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:49817 | Serial | 8669 | ||
| Permanent link to this record | |||||