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| Author | Guzzinati, G.; Ghielens, W.; Mahr, C.; Béché, A.; Rosenauer, A.; Calders, T.; Verbeeck, J. | ||||
| Title | Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer | Type | Dataset | ||
Year  |
2019 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | |||
| Keywords | Dataset; ADReM Data Lab (ADReM); Electron microscopy for materials research (EMAT) | ||||
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| Language | Wos | Publication Date | |||
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| ISSN | ISBN | Additional Links | UA library record | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:169114 | Serial | 6865 | ||
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