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| Record | |||||
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| Author | Laffez, P.; Retoux, R.; Boullay, P.; Zaghrioui, M.; Lacorre, P.; Van Tendeloo, G. | ||||
| Title | Transmission electron microscopy of NdNiO3 thin films on silicon substrates | Type | A1 Journal article | ||
Year  |
2000 | Publication | European physical journal: applied physics | Abbreviated Journal | Eur Phys J-Appl Phys |
| Volume | 12 | Issue | Pages | 55-60 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Paris | Editor | ||
| Language | Wos | 000165528800006 | Publication Date | 2003-06-20 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1286-0042;1286-0050; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 0.684 | Times cited | 16 | Open Access | |
| Notes | Approved | Most recent IF: 0.684; 2000 IF: 0.535 | |||
| Call Number | UA @ lucian @ c:irua:54781 | Serial | 3711 | ||
| Permanent link to this record | |||||