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| Author | Xu, Q.; Zandbergen, H.W.; van Dyck, D. | ||||
| Title | Imaging from atomic structure to electronic structure | Type | A1 Journal article | ||
Year  |
2012 | Publication | Micron | Abbreviated Journal | Micron |
| Volume | 43 | Issue | 4 | Pages | 524-531 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | This paper discusses the possibility of retrieving the electron distribution (with highlighted valence electron distribution information) of materials from recorded HREM images. This process can be achieved by solving two inverse problems: reconstruction of the exit wave and reconstruction of the electron distribution from exit waves. The first inverse problem can be solved using a focal series reconstruction method. We show that the second inverse problem can be solved by combining a series of exit waves recorded at different thickness conditions. This process is designed based on an improved understanding of the dynamical scattering process. It also explains the fundamental difficulty of obtaining the valence electron distribution information and the basis of our solution. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Oxford | Editor | ||
| Language | Wos | 000301702400005 | Publication Date | 2011-11-05 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0968-4328; | ISBN | Additional Links | UA library record; WoS full record | |
| Impact Factor | 1.98 | Times cited | Open Access | ||
| Notes | Fwo | Approved | Most recent IF: 1.98; 2012 IF: 1.876 | ||
| Call Number | UA @ lucian @ c:irua:93634 | Serial | 1553 | ||
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