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| Author | Leroux, F.; Bladt, E.; Timmermans, J.-P.; Van Tendeloo, G.; Bals, S. | ||||
| Title | Annular dark-field transmission electron microscopy for low contrast materials | Type | A1 Journal article | ||
Year  |
2013 | Publication | Microscopy and microanalysis | Abbreviated Journal | Microsc Microanal |
| Volume | 19 | Issue | 3 | Pages | 629-634 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | Imaging soft matter by transmission electron microscopy (TEM) is anything but straightforward. Recently, interest has grown in developing alternative imaging modes that generate contrast without additional staining. Here, we present a dark-field TEM technique based on the use of an annular objective aperture. Our experiments demonstrate an increase in both contrast and signal-to-noise ratio in comparison to conventional bright-field TEM. The proposed technique is easy to implement and offers an alternative imaging mode to investigate soft matter. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Cambridge, Mass. | Editor | ||
| Language | Wos | 000319126300014 | Publication Date | 2013-04-04 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1431-9276;1435-8115; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.891 | Times cited | 5 | Open Access | |
| Notes | 262348 Esmi; Fwo G002410n G018008 | Approved | Most recent IF: 1.891; 2013 IF: 2.161 | ||
| Call Number | UA @ lucian @ c:irua:108712 | Serial | 133 | ||
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