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| Author | Bertoni, G.; Verbeeck, J.; Brosens, F. | ||||
| Title | Fitting the momentum dependent loss function in EELS | Type | A1 Journal article | ||
Year  |
2011 | Publication | Microscopy research and technique | Abbreviated Journal | Microsc Res Techniq |
| Volume | 74 | Issue | 3 | Pages | 212-218 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Theory of quantum systems and complex systems | ||||
| Abstract | Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York, N.Y. | Editor | ||
| Language | Wos | 000288095200002 | Publication Date | 2010-07-06 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1059-910X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.147 | Times cited | 6 | Open Access | |
| Notes | Fwo; Esteem; Iap; Goa | Approved | Most recent IF: 1.147; 2011 IF: 1.792 | ||
| Call Number | UA @ lucian @ c:irua:88782UA @ admin @ c:irua:88782 | Serial | 1222 | ||
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