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Author Lichte, H.; Dunin-Borkowski, R.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. openurl 
  Title 65th birthdays of W. Owen Saxton, David J. Smith and Dirk Van Dyck / PICO 2013 From multislice to big bang Type ME3 Book as editor
  Year 2013 Publication Abbreviated Journal  
  Volume Issue Pages  
  Keywords ME3 Book as editor; Electron microscopy for materials research (EMAT)  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:109918 Serial 19  
Permanent link to this record
 
 
Author Van Aert, S.; Batenburg, J.; Van Tendeloo, S. pdf  openurl
  Title Atomen tellen Type A3 Journal article
  Year 2011 Publication Nederlands tijdschrift voor natuurkunde (1991) Abbreviated Journal  
  Volume 77 Issue 8 Pages 292-295  
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0926-4264 ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:94119 Serial 164  
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; Croitoru, M. pdf  doi
openurl 
  Title Atomic resolution electron tomography: a dream? Type A1 Journal article
  Year 2006 Publication International journal of materials research Abbreviated Journal Int J Mater Res  
  Volume 97 Issue 7 Pages 872-879  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000239916700003 Publication Date 2013-12-09  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1862-5282;2195-8556; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 0.681 Times cited 6 Open Access  
  Notes Approved Most recent IF: 0.681; 2006 IF: NA  
  Call Number UA @ lucian @ c:irua:60965 Serial 176  
Permanent link to this record
 
 
Author Van Aert, S.; van Dyck, D. pdf  doi
openurl 
  Title Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? Type A1 Journal article
  Year 2001 Publication Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties Abbreviated Journal  
  Volume 81 Issue 11 Pages 1833-1846  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication London Editor  
  Language Wos 000172199700016 Publication Date 2007-07-08  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1364-2812;1463-6417; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited 11 Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:47519 Serial 744  
Permanent link to this record
 
 
Author den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. doi  openurl
  Title Does a monochromator improve the precision in quantitative HRTEM? Type A1 Journal article
  Year 2001 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 89 Issue Pages 275-290  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000172667000004 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 22 Open Access  
  Notes Approved Most recent IF: 2.843; 2001 IF: 1.890  
  Call Number UA @ lucian @ c:irua:47518 Serial 746  
Permanent link to this record
 
 
Author Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. doi  openurl
  Title Electron channelling based crystallography Type A1 Journal article
  Year 2007 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 107 Issue 6/7 Pages 551-558  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000245341300015 Publication Date 2006-12-13  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 32 Open Access  
  Notes Approved Most recent IF: 2.843; 2007 IF: 1.996  
  Call Number UA @ lucian @ c:irua:64286 Serial 913  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. doi  openurl
  Title High-resolution electron microscopy and electron tomography: resolution versus precision Type A1 Journal article
  Year 2002 Publication Journal of structural biology Abbreviated Journal J Struct Biol  
  Volume 138 Issue Pages 21-33  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York Editor  
  Language Wos 000177978800003 Publication Date 2002-09-17  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1047-8477; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.767 Times cited 33 Open Access  
  Notes Approved Most recent IF: 2.767; 2002 IF: 4.194  
  Call Number UA @ lucian @ c:irua:47520 Serial 1446  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. doi  openurl
  Title High-resolution electron microscopy : from imaging toward measuring Type A1 Journal article
  Year 2002 Publication IEEE transactions on instrumentation and measurement Abbreviated Journal Ieee T Instrum Meas  
  Volume 51 Issue 4 Pages 611-615  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000178992000010 Publication Date 2003-01-03  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0018-9456; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.456 Times cited 13 Open Access  
  Notes Approved Most recent IF: 2.456; 2002 IF: 0.592  
  Call Number UA @ lucian @ c:irua:47521 Serial 1450  
Permanent link to this record
 
 
Author Schryvers, D.; Van Aert, S. isbn  openurl
  Title High-resolution visualization techniques : structural aspects Type H1 Book chapter
  Year 2012 Publication Abbreviated Journal  
  Volume Issue Pages 135-149  
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT)  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Berlin Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 978-3-642-20942-0 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:94124 Serial 1464  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D. pdf  doi
openurl 
  Title How to optimize the experimental design of quantitative atomic resolution TEM experiments? Type A1 Journal article
  Year 2004 Publication Micron Abbreviated Journal Micron  
  Volume 35 Issue Pages 425-429  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000221721000005 Publication Date 2004-03-06  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.98 Times cited 14 Open Access  
  Notes Approved Most recent IF: 1.98; 2004 IF: 1.464  
  Call Number UA @ lucian @ c:irua:47514 Serial 1495  
Permanent link to this record
 
 
Author Dunin-Borkowski, R.E.; Lichte, H.; Tillmann, K.; Van Aert, S.; Van Tendeloo, G. pdf  url
doi  openurl
  Title Introduction to a special issue in honour of W. Owen Saxton, David J. Smith and Dirk Van Dyck on the occasion of their 65th birthdays Type Editorial
  Year 2013 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 134 Issue Pages 1-1  
  Keywords Editorial; Electron microscopy for materials research (EMAT)  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Elsevier science bv Place of Publication Amsterdam Editor  
  Language Wos 000324474900001 Publication Date 2013-07-24  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 1 Open Access  
  Notes Approved Most recent IF: 2.843; 2013 IF: 2.745  
  Call Number UA @ lucian @ c:irua:109917 Serial 1721  
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. doi  openurl
  Title Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? Type A1 Journal article
  Year 2003 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 98 Issue Pages 27-42  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000186831500003 Publication Date 2003-04-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 26 Open Access  
  Notes Approved Most recent IF: 2.843; 2003 IF: 1.665  
  Call Number UA @ lucian @ c:irua:47516 Serial 1749  
Permanent link to this record
 
 
Author den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. pdf  doi
openurl 
  Title Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework Type A1 Journal article
  Year 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 104 Issue 2 Pages 83-106  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000230526400001 Publication Date 2005-04-09  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 70 Open Access  
  Notes Approved Most recent IF: 2.843; 2005 IF: 2.490  
  Call Number UA @ lucian @ c:irua:57229 Serial 1959  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. pdf  doi
openurl 
  Title Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example Type A1 Journal article
  Year 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 104 Issue 2 Pages 107-125  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000230526400002 Publication Date 2005-04-08  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 37 Open Access  
  Notes Approved Most recent IF: 2.843; 2005 IF: 2.490  
  Call Number UA @ lucian @ c:irua:57131 Serial 1960  
Permanent link to this record
 
 
Author Van Aert, S. openurl 
  Title Meer zien met onzichtbaar licht Type A2 Journal article
  Year 2007 Publication Karakter : tijdschrift van wetenschap Abbreviated Journal  
  Volume 18 Issue Pages 19-21  
  Keywords A2 Journal article; Electron microscopy for materials research (EMAT)  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Leuven Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1379-0390 ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:68658 Serial 1982  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. openurl 
  Title The notion of resolution Type H3 Book chapter
  Year 2008 Publication Abbreviated Journal  
  Volume Issue Pages 1228-1265  
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Berlin Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:68656 Serial 2370  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. openurl 
  Title The notion of resolution Type H3 Book chapter
  Year 2007 Publication Abbreviated Journal  
  Volume Issue Pages 1228-1265  
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Berlin Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:68657 Serial 2371  
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; Croitoru, M.D. openurl 
  Title Obstacles on the road towards atomic resolution tomography Type A3 Journal article
  Year 2005 Publication Microscoy and microanalysis Abbreviated Journal  
  Volume 11 Issue S2 Pages 238-239  
  Keywords A3 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:57129 Serial 2426  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. doi  openurl
  Title Optimal experimental design of STEM measurement of atom column positions Type A1 Journal article
  Year 2002 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 90 Issue Pages 273-289  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000174770900004 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 35 Open Access  
  Notes Approved Most recent IF: 2.843; 2002 IF: 1.772  
  Call Number UA @ lucian @ c:irua:47517 Serial 2483  
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; den Dekker, A.J. doi  openurl
  Title Physical limits on atomic resolution Type A1 Journal article
  Year 2004 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal  
  Volume 10 Issue Pages 153-157  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Cambridge, Mass. Editor  
  Language Wos 000188882100022 Publication Date 2004-08-11  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.891 Times cited 14 Open Access  
  Notes Approved Most recent IF: 1.891; 2004 IF: 2.389  
  Call Number UA @ lucian @ c:irua:47515 Serial 2616  
Permanent link to this record
 
 
Author Van Aert, S.; van Dyck, D.; den Dekker, A.J. url  doi
openurl 
  Title Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative Type A1 Journal article
  Year 2006 Publication Optics express Abbreviated Journal Opt Express  
  Volume 14 Issue 9 Pages 3830-3839  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000237296200013 Publication Date 2006-05-04  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1094-4087; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 3.307 Times cited 45 Open Access  
  Notes Fwo Approved Most recent IF: 3.307; 2006 IF: 4.009  
  Call Number UA @ lucian @ c:irua:58262 Serial 2883  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. doi  openurl
  Title Statistical experimental design for quantitative atomic resolution transmission electron microscopy Type H1 Book chapter
  Year 2004 Publication Abbreviated Journal Adv Imag Elect Phys  
  Volume Issue Pages 1-164  
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Academic Press Place of Publication San Diego, Calif. Editor  
  Language Wos 000223226700001 Publication Date 2011-01-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1076-5670; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited 13 Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:47513 Serial 3156  
Permanent link to this record
 
 
Author Van Aert, S. isbn  openurl
  Title Statistical parameter estimation theory : a tool for quantitative electron microscopy Type H1 Book chapter
  Year 2012 Publication Abbreviated Journal  
  Volume Issue Pages 281-309  
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT)  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Wiley-VCH Place of Publication Weinheim Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 978-3-527-31706-6 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:96693 Serial 3159  
Permanent link to this record
 
 
Author Batenburg, J.; Van Aert, S. pdf  openurl
  Title Three-dimensional reconstruction of a nanoparticle at atomic resolution Type A2 Journal article
  Year 2011 Publication ERCIM news Abbreviated Journal  
  Volume 86 Issue Pages 52  
  Keywords A2 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Le Chesnay Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0926-4981 ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:94120 Serial 3655  
Permanent link to this record
 
 
Author Jones, L.; Martinez, G.T.; Béché, A.; Van Aert, S.; Nellist, P.D. doi  openurl
  Title Getting the best from an imperfect detector : an alternative normalisation procedure for quantitative HAADF STEM Type A1 Journal article
  Year 2014 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal  
  Volume 20 Issue S3 Pages 126-127  
  Keywords A1 Journal article; Engineering Management (ENM); Electron microscopy for materials research (EMAT)  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Cambridge, Mass. Editor  
  Language Wos Publication Date 2014-08-27  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1431-9276 ISBN Additional Links UA library record  
  Impact Factor 1.891 Times cited Open Access  
  Notes Approved Most recent IF: 1.891; 2014 IF: 1.877  
  Call Number UA @ lucian @ c:irua:136445 Serial 4500  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. doi  isbn
openurl 
  Title High resolution electron microscopy from imaging towards measuring Type H2 Book chapter
  Year 2001 Publication ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 Abbreviated Journal  
  Volume Issue Pages 2081-2086  
  Keywords H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Ieee Place of Publication Editor  
  Language Wos Publication Date 2002-11-13  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 0-7803-6646-8 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:136870 Serial 4501  
Permanent link to this record
 
 
Author Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G. doi  isbn
openurl 
  Title The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data Type H1 Book chapter
  Year 2008 Publication Abbreviated Journal  
  Volume Issue Pages 97-98  
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Berlin Editor  
  Language Wos Publication Date 2009-03-17  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 978-3-540-85154-7 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:136865 Serial 4493  
Permanent link to this record
 
 
Author Goris, B.; De Beenhouwer, J.; de Backer, A.; Zanaga, D.; Batenburg, J.; Sanchez-Iglesias, A.; Liz-Marzan, L.; Van Aert, S.; Sijbers, J.; Van Tendeloo, G.; Bals, S. doi  openurl
  Title Investigating lattice strain in Au nanodecahedrons Type P1 Proceeding
  Year 2016 Publication Abbreviated Journal  
  Volume Issue Pages 11-12  
  Keywords P1 Proceeding; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date 2016-12-21  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 978-3-527-80846-5 ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access Not_Open_Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:145813 Serial 5144  
Permanent link to this record
 
 
Author Van Aert, S. pdf  openurl
  Title Atomen in 3D : Antwerpenaren brengen atomaire structuur nanodeeltjes in beeld Type Newspaper/Magazine/blog article
  Year 2011 Publication Chemie magazine Abbreviated Journal  
  Volume 7 Issue 3 Pages 9  
  Keywords Newspaper/Magazine/blog article; Electron microscopy for materials research (EMAT)  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0379-7651 ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:94122 Serial 163  
Permanent link to this record
 
 
Author Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. url  doi
openurl 
  Title Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy Type A1 Journal article
  Year 2009 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal  
  Volume 15 Issue S:2 Pages 464-465  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract (up)  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Cambridge, Mass. Editor  
  Language Wos 000208119100230 Publication Date 2009-07-27  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.891 Times cited 1 Open Access  
  Notes Approved Most recent IF: 1.891; 2009 IF: 3.035  
  Call Number UA @ lucian @ c:irua:96555UA @ admin @ c:irua:96555 Serial 178  
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