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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O. Defect characterization in high temperature implanted 6H-SiC using TEM 1997 Nuclear instruments and methods in physics research: B 127/128 17 UA library record; WoS full record; WoS citing articles doi
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