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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Montoya, E.; Bals, S.; Rossell, M.D.; Schryvers, D.; Van Tendeloo, G. Evaluation of top, angle, and side cleaned FIB samples for TEM analysis 2007 Microscopy research and technique 70 36 UA library record; WoS full record; WoS citing articles pdf doi
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