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  Author Title Year (down) Publication Volume Times cited Additional Links Links
Martinez, G.T.; van den Bos, K.H.W.; Alania, M.; Nellist, P.D.; Van Aert, S. Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy 2018 Ultramicroscopy 187 4 UA library record; WoS full record; WoS citing articles pdf url doi
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