toggle visibility
Search within Results:
Display Options:
Number of records found: 309

Select All    Deselect All
 | 
Citations
 | 
   print
Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
toggle visibility
On the phase-like nature of the 7M structure in Ni-Al”. Schryvers D, Tanner LE, MRS Japan: shape memory materials 18, 849 (1993)
toggle visibility
Radiation defects and ordered radiation patterns in Ni and Ni4Mo: a study by electron microscopy”. De Meulenaere P, Van Tendeloo G, van Landuyt J, Mommaert C, Severne G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 67, 745 (1993). http://doi.org/10.1080/01418619308207187
toggle visibility
Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite”. Schryvers D, van Landuyt JT, Proceedings Of The International Conference On Martensitic Transformations (icomat-92) , 263 (1993)
toggle visibility
Structure and phase transitions in C60 and C70 fullerites”. Van Tendeloo G, Muto S, van Heurck C, Amelinckx S, , 476 (1992)
toggle visibility
Trace element geochemistry of the system rock-thermal water –, suspended matter –, deposits in a granitic environment”. Pentcheva EN, Veldeman E, Van 't dack L, Gijbels R, , 1321 (1992)
toggle visibility
Free energy and structural phase transitions in mixed crystals: a microscopic derivation”. Theuns T, Michel KH, Zeitschrift für Physik: B 86, 125 (1992). http://doi.org/10.1007/BF01323556
toggle visibility
The hot electron distribution of two-dimensional electrons in a polar semiconductor at zero temperature”. Xu W, Peeters FM, Devreese JT, Journal of physics: C: condensed matter 3, 1783 (1991)
toggle visibility
Statistical grouping and controlling factors of dissolved trace elements in a surface water system”. Vandelannoote R, Blommaert W, Van 't dack L, Gijbels R, van Grieken R, Environmental technology letters 4, 363 (1983). http://doi.org/10.1080/09593338309384219
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: