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Crystal structures of polymerized fullerides AC60, A=K, Rb, Cs, and alkali-mediated interactions”. Verberck B, Michel KH, Nikolaev AV, The journal of chemical physics 116, 10462 (2002). http://doi.org/10.1063/1.1475745
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Single chain elasticity and thermoelasticity of polyethylene”. Titantah JT, Pierleoni C, Ryckaert J-P, The journal of chemical physics 117, 9028 (2002). http://doi.org/10.1063/1.1514974
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Leached natural saponite as the silicate source in the synthesis of aluminosilicate hexagonal mesoporous materials”. Linssen T, Cool P, Baroudi M, Cassiers K, Vansant EF, Lebedev O, van Landuyt J, The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical 106, 4470 (2002). http://doi.org/10.1021/jp015578p
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Optimal experimental design of STEM measurement of atom column positions”. Van Aert S, den Dekker AJ, van Dyck D, van den Bos A, Ultramicroscopy 90, 273 (2002). http://doi.org/10.1016/S0304-3991(01)00152-8
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Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids”. Ignatova VA, van Vaeck L, Gijbels R, Adams F, Vacuum 69, 307 (2002). http://doi.org/10.1016/S0042-207X(02)00350-0
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Damage functions and mechanism equations derived from limestone weathering in field exposure”. Delalieux F, Cardell-Fernandez C, Torfs K, Vleugels G, Van Grieken RE, Water, air and soil pollution 139, 75 (2002). http://doi.org/10.1023/A:1015827031669
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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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Einfluss verschiedener Silbersalze auf die Farbintensität von Silbergelb : analytische Untersuchungen”. De Vis K, Jembrih-Simbürger D, Schalm O, Schreiner M, Caen J, Zeitschrift für Kunsttechnologie und Konservierung 16, 147 (2002)
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