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“Accurate infrared spectroscopy determination of interstitial and precipitated oxygen in highly doped Czochralski-grown silicon”. de Gryse O, Clauws P, Rossou L, van Landuyt J, Vanhellemont J, The review of scientific instruments 70, 3661 (1999). http://doi.org/10.1063/1.1149974
Abstract: A method has been developed to determine the interstitial and precipitated oxygen concentration in highly doped n- and p-type silicon. 10-30-mu m-thin silicon samples in a mechanical stress-free state and without alteration of the thermal history are prepared and measured with Fourier transform infrared spectroscopy at 5.5-6 K. The measured oxygen contents in the as-grown Si samples agree well with those obtained with gas fusion analysis. In the highly boron-doped samples, the interstitial oxygen can be determined down to 10(17) cm(-3). (C) 1999 American Institute of Physics. [S0034-6748(99)04909-6].
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.515
Times cited: 5
DOI: 10.1063/1.1149974
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“Preliminary experiment of total reflection x-ray fluorescence using two glancing x-ray beams excitation”. Tsuji K, Sato T, Wagatsuma K, Claes M, Van Grieken R, The review of scientific instruments 70, 1621 (1999). http://doi.org/10.1063/1.1149687
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1063/1.1149687
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“Indoor air quality at the Correr Museum, Venice, Italy”. Camuffo D, Brimblecombe P, Van Grieken R, Busse H-J, Sturaro G, Valentino A, Bernardi A, Blades N, Shooter D, de Bock L, Gysels K, Wieser M, Kim O, The science of the total environment 236, 135 (1999). http://doi.org/10.1016/S0048-9697(99)00262-4
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0048-9697(99)00262-4
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“Inorganic deterioration affecting the Altamira Cave, N Spain: quantitative approach to wall-corrosion (solutional etching) processes induced by visitors”. Sánchez-Moral S, Soler V, Cañaveras JC, Sanz-Rubio E, Van Grieken R, Gysels K, The science of the total environment 243/244, 67 (1999). http://doi.org/10.1016/S0048-9697(99)00348-4
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0048-9697(99)00348-4
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“XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers”. Conard T, de Witte H, Loo R, Verheyen P, Vandervorst W, Caymax M, Gijbels R, Thin solid films : an international journal on the science and technology of thin and thick films 343/344, 583 (1999). http://doi.org/10.1016/S0040-6090(99)00122-4
Keywords: A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT)
Impact Factor: 1.879
Times cited: 1
DOI: 10.1016/S0040-6090(99)00122-4
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“Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation”. Kuczumov A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, X-ray spectrometry 28, 282 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
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“Progress in laboratory grazing emission X-ray fluorescence spectrometry”. Claes M, de Bokx P, Van Grieken R, X-ray spectrometry 28, 224 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<224::AID-XRS337>3.3.CO;2-W
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1002/(SICI)1097-4539(199907/08)28:4<224::AID-XRS337>3.3.CO;2-W
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