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“Spark-source mass-spectrometric sensitivity factors for elements in a graphite matrix”. Vanderborght B, Van Grieken R, Talanta : the international journal of pure and applied analytical chemistry 26, 461 (1979). http://doi.org/10.1016/0039-9140(79)80111-3
Abstract: Relative sensitivity factors for determination of 41 elements by spark-source mass-spectrometry have been measured. The samples were pressed into graphite electrodes and ionized with a radiofrequency spark. The mass spectra were recorded on a photoplate and the resulting data processed by a computer. Indium was used as standard and the relative sensitivity factors for both singly- and doubly-charged ions were determined with reference to the singly-charged indium ion, with an overall error of 30%. The mean analysis precision was 16%.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/0039-9140(79)80111-3
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“Automated evaluation of photographically recorded spark-source mass spectra”. Vanderborght B, Van Grieken R, Analytica chimica acta 103, 223 (1978). http://doi.org/10.1016/S0003-2670(01)84041-1
Abstract: A computer routine was developed for qualitative and quantitative analysis of photographically recorded spark-source mass spectra. Particular attention is given to the case of a graphite matrix. The program starts from the line intensities (expressed as Seidel values) and isotope masses calculated from the densitometer readings by a commercially available routine. From the intensities in the different exposures (typically 15 stages), it computes the parameters for the linear parts of the density curves for each ion. Taking into account mutual interferences of multivalent ions, isotope or C-clusters, oxide, carbide and dicarbide ions, the program automatically identifies and then quantifies the elements present. The precision of the results is around 5%. Reading and complete processing of one photoplate is achieved within 23 h.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0003-2670(01)84041-1
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“Reduction of trace metal levels in analytical-grade activated carbon”. Vanderborght B, Van Grieken R, Analytica chimica acta 89, 399 (1977). http://doi.org/10.1016/S0003-2670(01)84739-5
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
DOI: 10.1016/S0003-2670(01)84739-5
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“Energy-dispersive X-ray fluorescence for trace metals analysis of water”. Vanderborght B, Van Grieken R page 1 (1975).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Perspectieven voor energie-dispersieve X-stralen fluorescentie bij de wateranalyse”. Vanderborght B, Van Grieken R, Hydrographica 1, 19 (1975)
Keywords: A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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