| Vincze, L.; Vekemans, B.; Brenker, F.E.; Falkenberg, G.; Rickers, K.; Somogyi, A.; Kersten, M.; Adams, F. |
Three-dimensional trace element analysis by confocal X-ray microfluorescence imaging |
2004 |
Analytical chemistry |
76 |
|
UA library record; WoS full record; WoS citing articles |
