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Author
Title
Year
Publication
Volume
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Guzzinati, G.
;
Ghielens, W.
;
Mahr, C.
;
Béché, A.
;
Rosenauer, A.
;
Calders, T.
;
Verbeeck, J.
Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer
2019
UA library record