| Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
| Moors, K.; Sorée, B.; Magnus, W. |
Resistivity scaling in metallic thin films and nanowires due to grain boundary and surface roughness scattering |
2017 |
Microelectronic engineering |
167 |
6 |
UA library record; WoS full record; WoS citing articles |
| Moors, K.; Sorée, B.; Magnus, W. |
Validity criteria for Fermi's golden rule scattering rates applied to metallic nanowires |
2016 |
Journal of physics : condensed matter |
28 |
2 |
UA library record; WoS full record; WoS citing articles |
| Moors, K.; Sorée, B.; Magnus, W. |
Analytic solution of Ando's surface roughness model with finite domain distribution functions |
2015 |
18th International Workshop On Computational Electronics (iwce 2015) |
|
|
UA library record; WoS full record |
| Moors, K.; Sorée, B.; Magnus, W. |
Modeling and tackling resistivity scaling in metal nanowires |
2015 |
International Conference on Simulation of Semiconductor Processes and Devices : [proceedings]
T2 – International Conference on Simulation of Semiconductor Processes and, Devices (SISPAD), SEP 09-11, 2015, Washington, DC |
|
|
UA library record; WoS full record |
| Moors, K.; Sorée, B.; Magnus, W. |
Modeling surface roughness scattering in metallic nanowires |
2015 |
Journal of applied physics |
118 |
11 |
UA library record; WoS full record; WoS citing articles |
