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Author Title Year (down) Publication Volume Times cited Additional Links
Béché, A.; Rouviere, J.L.; Barnes, J.P.; Cooper, D. Strain measurement at the nanoscale : comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography 2013 Ultramicroscopy 131 73 UA library record; WoS full record; WoS citing articles
Béché, A.; Rouvière, J.L.; Barnes, J.P.; Cooper, D. Dark field electron holography for strain measurement 2011 Ultramicroscopy 111 31 UA library record; WoS full record; WoS citing articles