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| Author | Vanderborght, B.; Van Grieken, R. | ||||
| Title | Spark-source mass-spectrometric sensitivity factors for elements in a graphite matrix | Type | A1 Journal article | ||
Year  |
1979 | Publication | Talanta : the international journal of pure and applied analytical chemistry | Abbreviated Journal | |
| Volume | 26 | Issue | 6 | Pages | 461-465 |
| Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | Relative sensitivity factors for determination of 41 elements by spark-source mass-spectrometry have been measured. The samples were pressed into graphite electrodes and ionized with a radiofrequency spark. The mass spectra were recorded on a photoplate and the resulting data processed by a computer. Indium was used as standard and the relative sensitivity factors for both singly- and doubly-charged ions were determined with reference to the singly-charged indium ion, with an overall error of 30%. The mean analysis precision was 16%. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | A1979GX58000005 | Publication Date | 2002-07-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0039-9140; 1873-3573 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:113630 | Serial | 8563 | ||
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