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| Author | Pourbabak, S.; Orekhov, A.; Schryvers, D. | ||||
| Title | Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires | Type | A1 Journal article | ||
Year  |
2020 | Publication | Microscopy Research And Technique | Abbreviated Journal | Microsc Res Techniq |
| Volume | Issue | Pages | 1-7 | ||
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | A method to prepare TEM specimens from metallic microwires and based on conventional twin-jet electropolishing is introduced. The wire is embedded in an opaque epoxy resin medium and the hardened resin is mechanically polished to reveal the wire on both sides. The resin containing wire is then cut into discs of the appropriate size. The obtained embedded wire is electropolished in a conventional twin-jet electropolishing machine until electron transparency in large areas without radiation damage is achieved. | ||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000567944200001 | Publication Date | 2020-09-28 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1059-910x | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.5 | Times cited | Open Access | OpenAccess | |
| Notes | ; Fonds Wetenschappelijk Onderzoek, Grant/Award Number: G.0366.15N ; | Approved | Most recent IF: 2.5; 2020 IF: 1.147 | ||
| Call Number | UA @ admin @ c:irua:171969 | Serial | 6642 | ||
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