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| Record | |||||
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| Author | Suvorov, A.V.; Lebedev, O.I.; Suvorova, A.A.; van Landuyt, J.; Usov, I.O. | ||||
| Title | Defect characterization in high temperature implanted 6H-SiC using TEM | Type | A1 Journal article | ||
Year  |
1997 | Publication | Nuclear instruments and methods in physics research: B | Abbreviated Journal | Nucl Instrum Meth B |
| Volume | 127/128 | Issue | Pages | 347-349 | |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | A1997XG60500078 | Publication Date | 2002-07-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0168-583X; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.109 | Times cited | 17 | Open Access | |
| Notes | Approved | Most recent IF: 1.109; 1997 IF: 1.016 | |||
| Call Number | UA @ lucian @ c:irua:21411 | Serial | 613 | ||
| Permanent link to this record | |||||