| Home | << 1 >> |
|
| Record | |||||
|---|---|---|---|---|---|
| Author | Šmit, Ž.; Janssens, K.; Proost, K.; Langus, I. | ||||
| Title | Confocal μ-XRF depth analysis of paint layers | Type | A1 Journal article | ||
Year  |
2004 | Publication | Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms | Abbreviated Journal | Nucl Instrum Meth B |
| Volume | 219 | Issue | Pages | 35-40 | |
| Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | Focused narrow-band beam of the synchrotron radiation was used for in-depth analysis of historic and modern paint layers. The fluorescent radiation induced by 21 keV impact radiation was detected by a Si(Li) detector equipped with a polycapillary X-ray lens in con-focal geometry. Scanning of the sample was performed by a motorized xyz stage. Space resolution of 30 ìm was achieved. The procedure of evaluation of concentrations was based on the independent parameter method and included absorption of radiation in the outer layers and secondary fluorescence enhancement induced by hard X-rays of the same and neighboring layers. | ||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | 000221895800009 | Publication Date | 2004-02-21 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0168-583x | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.109 | Times cited | 69 | Open Access | |
| Notes | Approved | Most recent IF: 1.109; 2004 IF: 0.997 | |||
| Call Number | UA @ admin @ c:irua:71386 | Serial | 5552 | ||
| Permanent link to this record | |||||