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| Author | Janssens, K.H.; Adams, F.C.; van Langevelde, F.; Vis, R.D.; Jones, K.W.; Rivers, M.; Sutton, S. | ||||
| Title | Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis | Type | A3 Journal article | ||
Year  |
1992 | Publication | Advances in X-ray analysis | Abbreviated Journal | |
| Volume | 35 | Issue | Pages | 1265-1273 | |
| Keywords | A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Editor | |||
| Language | Wos | Publication Date | |||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0376-0308 | ISBN | Additional Links | UA library record | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:2811 | Serial | 5530 | ||
| Permanent link to this record | |||||