| Record |
| Author |
Janssens, K.; Vekemans, B.; Adams, F.; van Espen, P.; Mutsaers, P. |
| Title |
Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting |
Type |
A1 Journal article |
Year  |
1996 |
Publication |
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms
T2 – 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy |
Abbreviated Journal |
7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY |
| Volume |
109 |
Issue |
|
Pages |
179-185 |
| Keywords |
A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
| Abstract |
The integration of the nonlinear least squares X-ray spectrum evaluation progam AXIL. into a mu-PIXE and a mu-XRF setup is discussed. The use of the software when procesing data sets derived from biological and geological samples is described. |
| Address |
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| Corporate Author |
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Thesis |
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| Publisher |
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Place of Publication |
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Editor |
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| Language |
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Wos |
A1996UV44400035 |
Publication Date |
2002-07-25 |
| Series Editor |
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Series Title |
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Abbreviated Series Title |
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| Series Volume |
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Series Issue |
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Edition |
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| ISSN |
0168-583x |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
| Impact Factor |
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Times cited |
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Open Access |
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| Notes |
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Approved |
no |
| Call Number |
UA @ admin @ c:irua:95887 |
Serial |
5457 |
| Permanent link to this record |
