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| Record | |||||
|---|---|---|---|---|---|
| Author | Van Tendeloo, G. | ||||
| Title | TEM characterization of structural defects | Type | H1 Book chapter | ||
Year  |
1996 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 473-507 | ||
| Keywords | H1 Book chapter; Electron microscopy for materials research (EMAT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Plenum Press | Place of Publication | New York | Editor | |
| Language | Wos | A1996BF84E00042 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | ISBN | Additional Links | UA library record; WoS full record; | ||
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ lucian @ c:irua:16865 | Serial | 3477 | ||
| Permanent link to this record | |||||