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| Record | |||||
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| Author | Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. | ||||
| Title | Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) | Type | A1 Journal article | ||
Year  |
1999 | Publication | Journal of analytical atomic spectrometry | Abbreviated Journal | J Anal Atom Spectrom |
| Volume | 14 | Issue | Pages | 429-434 | |
| Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor | ||
| Language | Wos | 000079138500015 | Publication Date | 2002-07-26 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0267-9477;1364-5544; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 3.379 | Times cited | 10 | Open Access | |
| Notes | Approved | Most recent IF: 3.379; 1999 IF: 3.677 | |||
| Call Number | UA @ lucian @ c:irua:24928 | Serial | 3390 | ||
| Permanent link to this record | |||||