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| Record | |||||
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| Author | van Vaeck, L.; Adriaens, A.; Gijbels, R. | ||||
| Title | Static secondary ion mass spectrometry (S-SIMS): part 1: methodology and structural interpretation | Type | A1 Journal article | ||
Year  |
1999 | Publication | Mass spectrometry reviews | Abbreviated Journal | Mass Spectrom Rev |
| Volume | 18 | Issue | Pages | 1-47 | |
| Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York, N.Y. | Editor | ||
| Language | Wos | 000082318900001 | Publication Date | 0000-00-00 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0277-7037 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 9.373 | Times cited | 112 | Open Access | |
| Notes | Approved | Most recent IF: 9.373; 1999 IF: 6.885 | |||
| Call Number | UA @ lucian @ c:irua:24931 | Serial | 3151 | ||
| Permanent link to this record | |||||