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| Record | |||||
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| Author | Verlinden, G.; Gijbels, R.; Geuens, I. | ||||
| Title | Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals | Type | A1 Journal article | ||
Year  |
1999 | Publication | Journal of the American Society for Mass Spectrometry | Abbreviated Journal | J Am Soc Mass Spectr |
| Volume | 10 | Issue | Pages | 1016-1027 | |
| Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | New York, N.Y. | Editor | ||
| Language | Wos | 000082614500013 | Publication Date | 2002-07-25 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1044-0305;1879-1123; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.786 | Times cited | 4 | Open Access | |
| Notes | Approved | Most recent IF: 2.786; 1999 IF: 3.460 | |||
| Call Number | UA @ lucian @ c:irua:24930 | Serial | 2760 | ||
| Permanent link to this record | |||||