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| Record | |||||
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| Author | Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. | ||||
| Title | Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example | Type | A1 Journal article | ||
Year  |
2005 | Publication | Ultramicroscopy | Abbreviated Journal | Ultramicroscopy |
| Volume | 104 | Issue | 2 | Pages | 107-125 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | Amsterdam | Editor | ||
| Language | Wos | 000230526400002 | Publication Date | 2005-04-08 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0304-3991; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 2.843 | Times cited | 37 | Open Access | |
| Notes | Approved | Most recent IF: 2.843; 2005 IF: 2.490 | |||
| Call Number | UA @ lucian @ c:irua:57131 | Serial | 1960 | ||
| Permanent link to this record | |||||