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| Author | Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. | ||||
| Title | EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments | Type | A1 Journal article | ||
Year  |
2004 | Publication | X-ray spectrometry | Abbreviated Journal | X-Ray Spectrom |
| Volume | 33 | Issue | 5 | Pages | 326-333 |
| Keywords | A1 Journal article; Electron microscopy for materials research (EMAT); AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Place of Publication | London | Editor | ||
| Language | Wos | 000223880800002 | Publication Date | 2004-04-01 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0049-8246;1097-4539; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | 1.298 | Times cited | 13 | Open Access | |
| Notes | Approved | Most recent IF: 1.298; 2004 IF: 1.391 | |||
| Call Number | UA @ lucian @ c:irua:48786 | Serial | 1076 | ||
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