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“Element Specific Monolayer Depth Profiling”. Macke S, Radi A, Hamann-Borrero JE, Verna A, Bluschke M, Brück S, Goering E, Sutarto R, He F, Cristiani G, Wu M, Benckiser E, Habermeier H-U, Logvenov G, Gauquelin N, Botton GA, Kajdos AP, Stemmer S, Sawatzky GA, Haverkort MW, Keimer B, Hinkov V, Advanced Materials 26, 6554 (2014). http://doi.org/10.1002/adma.201402028
Abstract: The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.
Keywords: A1 Journal Article; Electron Microscopy for Materials Science (EMAT)
Impact Factor: 19.791
Times cited: 34
DOI: 10.1002/adma.201402028
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“Crosshatching on La0.5Ca0.5MnO3 ultrathin films epitaxially grown on SrTiO3(100)”. Wang Z-H, Lebedev OI, Van Tendeloo G, Cristiani G, Habermeier H-U, Physical review : B : condensed matter and materials physics 77, 1 (2008). http://doi.org/10.1103/PhysRevB.77.115330
Abstract: The morphological evolution in La(0.5)Ca(0.5)MnO(3)/SrTiO(3)(100) ultrathin films has been revealed by atomic force microscopy. It was found that ordered linear defects, which are in 1-2 unit cells high and oriented along the cubic [110] and [100] directions, first appear on the smooth surface of films with a thickness of 10 nm. As the epitaxial growth proceeds, these lines on surface develop into a crosshatch pattern for films with a thickness of 25 nm. Using the results of transmission electron microscopy and electrical measurements, we discuss the interplay between the surface pattern formation, the internal dislocation structure, and the variations in the electrical properties.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 8
DOI: 10.1103/PhysRevB.77.115330
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“Structure-properties relationship in ferromagnetic superconducting RuSr2GdCu2O8”. Lebedev OI, Van Tendeloo G, Cristiani G, Habermeier H-U, Matveev AT, Physical review : B : condensed matter and materials physics 71, 134523 (2005). http://doi.org/10.1103/PhysRevB.71.134523
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 16
DOI: 10.1103/PhysRevB.71.134523
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“Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices”. Holden T, Habermeier H-U, Cristiani G, Golnik A, Boris A, Pimenov A, Humlicek J, Lebedev OI, Van Tendeloo G, Keimer B, Bernhard C, Physical review : B : condensed matter and materials physics 69, 064505 (2004). http://doi.org/10.1103/PhysRevB.69.064505
Abstract: The far-infrared dielectric response of superlattices (SL) composed of superconducting YBa2Cu3O7 (YBCO) and ferromagnetic La0.67Ca0.33MnO3 (LCMO) has been investigated by ellipsometry. A drastic decrease of the free-carrier response is observed which involves an unusually large length scale of d(crit)approximate to20 nm in YBCO and d(crit)approximate to10 nm in LCMO. A corresponding suppression of metallicity is not observed in SL's where LCMO is replaced by the paramagnetic metal LaNiO3. Our data suggest that either a long-range charge transfer from the YBCO to the LCMO layers or alternatively a strong coupling of the charge carriers to the different and competitive kind of magnetic correlations in the LCMO and YBCO layers is at the heart of the observed metal-insulator transition. The low free-carrier response observed in the far-infrared dielectric response of the magnetic superconductor RuSr2GdCu2O8 is possibly related to this effect.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 101
DOI: 10.1103/PhysRevB.69.064505
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“Cuprate/manganite superlattices: a model system for a bulk ferromagnetic superconductor”. Habermeier H-U, Cristiani G, Kremer RK, Lebedev O, Van Tendeloo G, Physica: C : superconductivity 364/365, 298 (2001). http://doi.org/10.1016/S0921-4534(01)00775-4
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.404
Times cited: 91
DOI: 10.1016/S0921-4534(01)00775-4
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