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“Trace element fingerprinting of façon-de-Venise glass”. Šmit Ž, Bulska E, Janssens K, Bulska E, Wagner B, Kos M, Lazar I, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 239, 94 (2005). http://doi.org/10.1016/J.NIMB.2005.06.182
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.109
Times cited: 27
DOI: 10.1016/J.NIMB.2005.06.182
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“Analysis of façon-de-Venise glass originating from Central and Western Europe”. Šmit Ž, Janssens K, Schalm O, Kos M page 165 (2005).
Keywords: H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Confocal μ-XRF depth analysis of paint layers”. Šmit Ž, Janssens K, Proost K, Langus I, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms 219, 35 (2004). http://doi.org/10.1016/J.NIMB.2004.01.024
Abstract: Focused narrow-band beam of the synchrotron radiation was used for in-depth analysis of historic and modern paint layers. The fluorescent radiation induced by 21 keV impact radiation was detected by a Si(Li) detector equipped with a polycapillary X-ray lens in con-focal geometry. Scanning of the sample was performed by a motorized xyz stage. Space resolution of 30 ìm was achieved. The procedure of evaluation of concentrations was based on the independent parameter method and included absorption of radiation in the outer layers and secondary fluorescence enhancement induced by hard X-rays of the same and neighboring layers.
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.109
Times cited: 69
DOI: 10.1016/J.NIMB.2004.01.024
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