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Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. openurl 
  Title The notion of resolution Type H3 Book chapter
  Year (down) 2008 Publication Abbreviated Journal  
  Volume Issue Pages 1228-1265  
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Berlin Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:68656 Serial 2370  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. openurl 
  Title The notion of resolution Type H3 Book chapter
  Year (down) 2007 Publication Abbreviated Journal  
  Volume Issue Pages 1228-1265  
  Keywords H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Berlin Editor  
  Language Wos Publication Date 0000-00-00  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:68657 Serial 2371  
Permanent link to this record
 
 
Author den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D. pdf  doi
openurl 
  Title Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework Type A1 Journal article
  Year (down) 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 104 Issue 2 Pages 83-106  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000230526400001 Publication Date 2005-04-09  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 70 Open Access  
  Notes Approved Most recent IF: 2.843; 2005 IF: 2.490  
  Call Number UA @ lucian @ c:irua:57229 Serial 1959  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H. pdf  doi
openurl 
  Title Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example Type A1 Journal article
  Year (down) 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 104 Issue 2 Pages 107-125  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000230526400002 Publication Date 2005-04-08  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 37 Open Access  
  Notes Approved Most recent IF: 2.843; 2005 IF: 2.490  
  Call Number UA @ lucian @ c:irua:57131 Serial 1960  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. doi  openurl
  Title Statistical experimental design for quantitative atomic resolution transmission electron microscopy Type H1 Book chapter
  Year (down) 2004 Publication Abbreviated Journal Adv Imag Elect Phys  
  Volume Issue Pages 1-164  
  Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Academic Press Place of Publication San Diego, Calif. Editor  
  Language Wos 000223226700001 Publication Date 2011-01-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1076-5670; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited 13 Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:47513 Serial 3156  
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A. doi  openurl
  Title Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? Type A1 Journal article
  Year (down) 2003 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 98 Issue Pages 27-42  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000186831500003 Publication Date 2003-04-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 26 Open Access  
  Notes Approved Most recent IF: 2.843; 2003 IF: 1.665  
  Call Number UA @ lucian @ c:irua:47516 Serial 1749  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D. doi  openurl
  Title High-resolution electron microscopy : from imaging toward measuring Type A1 Journal article
  Year (down) 2002 Publication IEEE transactions on instrumentation and measurement Abbreviated Journal Ieee T Instrum Meas  
  Volume 51 Issue 4 Pages 611-615  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York, N.Y. Editor  
  Language Wos 000178992000010 Publication Date 2003-01-03  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0018-9456; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.456 Times cited 13 Open Access  
  Notes Approved Most recent IF: 2.456; 2002 IF: 0.592  
  Call Number UA @ lucian @ c:irua:47521 Serial 1450  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. doi  openurl
  Title High-resolution electron microscopy and electron tomography: resolution versus precision Type A1 Journal article
  Year (down) 2002 Publication Journal of structural biology Abbreviated Journal J Struct Biol  
  Volume 138 Issue Pages 21-33  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication New York Editor  
  Language Wos 000177978800003 Publication Date 2002-09-17  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1047-8477; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.767 Times cited 33 Open Access  
  Notes Approved Most recent IF: 2.767; 2002 IF: 4.194  
  Call Number UA @ lucian @ c:irua:47520 Serial 1446  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A. doi  openurl
  Title Optimal experimental design of STEM measurement of atom column positions Type A1 Journal article
  Year (down) 2002 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 90 Issue Pages 273-289  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000174770900004 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 35 Open Access  
  Notes Approved Most recent IF: 2.843; 2002 IF: 1.772  
  Call Number UA @ lucian @ c:irua:47517 Serial 2483  
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D. doi  isbn
openurl 
  Title High resolution electron microscopy from imaging towards measuring Type H2 Book chapter
  Year (down) 2001 Publication ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 Abbreviated Journal  
  Volume Issue Pages 2081-2086  
  Keywords H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Ieee Place of Publication Editor  
  Language Wos Publication Date 2002-11-13  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 0-7803-6646-8 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:136870 Serial 4501  
Permanent link to this record
 
 
Author den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P. doi  openurl
  Title Does a monochromator improve the precision in quantitative HRTEM? Type A1 Journal article
  Year (down) 2001 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy  
  Volume 89 Issue Pages 275-290  
  Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Amsterdam Editor  
  Language Wos 000172667000004 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 2.843 Times cited 22 Open Access  
  Notes Approved Most recent IF: 2.843; 2001 IF: 1.890  
  Call Number UA @ lucian @ c:irua:47518 Serial 746  
Permanent link to this record
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