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Author |
Haller, M.; Radtke, M.; Knöchel, A.; Clöck, W.; Sutton, S.; Janssens, K.; Vincze, L. |
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Title |
Quantification of SY-XRF measurements at the X-ray microprobe |
Type |
A3 Journal article |
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Year  |
1996 |
Publication |
HASYLAB Jahresbericht |
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Pages |
956-957 |
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Keywords |
A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:21745 |
Serial |
5792 |
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Author |
Janssens, K.H.; Adams, F.C.; van Langevelde, F.; Vis, R.D.; Jones, K.W.; Rivers, M.; Sutton, S. |
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Title |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
Type |
A3 Journal article |
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Year |
1992 |
Publication |
Advances in X-ray analysis |
Abbreviated Journal |
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Volume |
35 |
Issue |
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Pages |
1265-1273 |
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Keywords |
A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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ISSN |
0376-0308 |
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UA library record |
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Open Access |
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Notes |
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no |
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Call Number |
UA @ admin @ c:irua:2811 |
Serial |
5530 |
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Author |
Janssens, K.; van Langevelde, F.; Adams, F.; Vis, R.; Sutton, S.; Rivers, M.; Jones, K.; Bowen, D. |
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Title |
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis |
Type |
P3 Proceeding |
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Year |
1992 |
Publication |
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Abbreviated Journal |
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Pages |
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Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Open Access |
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Notes |
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no |
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Call Number |
UA @ admin @ c:irua:4190 |
Serial |
5531 |
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