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Author Title Year (down) Publication Volume Times cited Additional Links
Bichlmeier, S.; Janssens, K.; Heckel, J.; Hoffmann, P.; Ortner, H.M. Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer 2002 X-ray spectrometry 31 12 UA library record; WoS full record; WoS citing articles
Bichlmeier, S.; Janssens, K.; Heckel, J.; Gibson, D.; Hoffmann, P.; Ortner, H.M. Component selection for a compact micro-XRF spectrometer 2001 X-ray spectrometry 30 33 UA library record; WoS full record; WoS citing articles