| Author |
Title |
Year  |
Publication |
Volume |
Times cited |
Additional Links |
| Vittiglio, G.; Bichlmeier, S.; Klinger, P.; Heckel, J.; Fuzhong, W.; Vincze, L.; Janssens, K.; Engström, P.; Rindby, A.; Dietrich, K.; Jembrih-Simbürger, D.; Schreiner, M.; Denis, D.; Lakdar, A.; Lamotte, A. |
A compact μ-XRF spectrometer for (in-situ) analyses of cultural heritage and forensic materials |
2004 |
Nuclear instruments and methods in physics research B |
213 |
|
UA library record |
| Bichlmeier, S.; Janssens, K.; Heckel, J.; Hoffmann, P.; Ortner, H.M. |
Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer |
2002 |
X-ray spectrometry |
31 |
12 |
UA library record; WoS full record; WoS citing articles |
| Bichlmeier, S.; Janssens, K.; Heckel, J.; Gibson, D.; Hoffmann, P.; Ortner, H.M. |
Component selection for a compact micro-XRF spectrometer |
2001 |
X-ray spectrometry |
30 |
33 |
UA library record; WoS full record; WoS citing articles |
