| Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Döcking, H. |
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments |
2004 |
X-ray spectrometry |
33 |
13 |
UA library record; WoS full record; WoS citing articles |
