“A compact μ-XRF spectrometer for (in-situ) analyses of cultural heritage and forensic materials”. Vittiglio G, Bichlmeier S, Klinger P, Heckel J, Fuzhong W, Vincze L, Janssens K, Engström P, Rindby A, Dietrich K, Jembrih-Simbürger D, Schreiner M, Denis D, Lakdar A, Lamotte A, Nuclear instruments and methods in physics research B 213, 693 (2004)
Keywords: A3 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
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“Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 12
DOI: 10.1002/XRS.563
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“Component selection for a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Gibson D, Hoffmann P, Ortner HM, X-ray spectrometry 30, 8 (2001). http://doi.org/10.1002/XRS.457
Keywords: A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)
Impact Factor: 1.298
Times cited: 33
DOI: 10.1002/XRS.457
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