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“Electron microscopy of C60 and C70 fullerites”. Van Tendeloo G, Amelinckx S Springer, Berlin, page 182 (1993).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite”. Schryvers D, van Landuyt JT, Proceedings Of The International Conference On Martensitic Transformations (icomat-92) , 263 (1993)
Keywords: P1 Proceeding; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Times cited: 1
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“EM study of twinning in the Ni5Al3 bainitic phase”. Schryvers D, Ma Y, Toth L, Tanner LE, Twinning in advanced materials , 395 (1993)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
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“Giant Pd clusters observed by high resolution electron microscopy”. Volkov VV, Van Tendeloo G, Vargaftik MN, Stolyarov IP, Moiseev II, Mendeleev communications , 187 (1993)
Abstract: The giant cationic palladium clusters, approximate formula Pd561L60(OAc)180 (L = Dipy, Phen), were characterized by electron diffraction and high resolution microscopy to contain an FCC metal core, most of the larger Pd particles (8 nm) exhibiting multiple twinning, evidence for a distorted icosahedral structure.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.34
Times cited: 10
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“Giant Pd clusters observed by HREM”. Volkov VV, Van Tendeloo G, Vargaftik MN, Stolygarov IP, Moiseev II, Mendeleev communications , 187 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.34
Times cited: 10
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“Graphene textures: tubules and whiskers related to fullerene crystallography”. Van Tendeloo G, Amelinckx S, van Landuyt J, Acta crystallographica: section A: foundations of crystallography 49, 355 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.307
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“High-resolution electron microscopy observations of large Pd clusters”. Volkov VV, Van Tendeloo G, Vargaftik MN, Moiseev II, Journal of crystal growth 132, 359 (1993). http://doi.org/10.1016/0022-0248(93)90059-6
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.698
Times cited: 7
DOI: 10.1016/0022-0248(93)90059-6
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“High-resolution electron microscopy of structural defects in crystalline C60 and C70”. Muto S, Van Tendeloo G, Amelinckx S, Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 67, 443 (1993). http://doi.org/10.1080/13642819308207685
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 31
DOI: 10.1080/13642819308207685
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“HREM and ED study of the displacive transformation of the Ni2Al phase in a Ni65Al35 alloy and associated with the martensitic transformation”. Muto S, Schryvers D, Merk N, Tanner LE, Acta metallurgica et materialia 41, 2377 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 31
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“In situ high resolution electron microscopy observation of electron-irradiation-induced martensitic transformation in a Ni63Al37 alloy”. Muto S, Schryvers D, Journal of alloys and compounds 199, 1 (1993). http://doi.org/10.1016/0925-8388(93)90422-J
Abstract: An electron-irradiation-induced transformation from cubic beta2 austenite to monoclinic 7M martensite was observed in situ under high resolution electron microscopy conditions in a thin foil of Ni63Al37 beta2 phase (B2, CsCl structure), with the start temperature of the martensitic transformation below but very close to room temperature. The structure of the martensite is consistent with thermoelastic or stress-induced martensite at this composition, including the existence of multiple stacking faults. The transformation is described by a gradual increase in the shear and shuffle amplitudes already existing in the precursor domains. Possible origins of the transformation are discussed.
Keywords: A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
Impact Factor: 2.999
Times cited: 8
DOI: 10.1016/0925-8388(93)90422-J
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“In-situ HREM observation of electron-irradation-induced martensitic transformation in a Ni63Al37 alloy”. Muto S, Schryvers D, Journal of alloys and compounds 199, 1 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.999
Times cited: 8
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“Inelastic scattering of high-energy electrons in a crystal in thermal equilibrium with the environment: part 2: solution of the equations and applications to concrete cases”. Fanidis C, van Dyck D, van Landuyt J, Ultramicroscopy 48, 133 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Impact Factor: 2.436
Times cited: 6
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“Infrared spectra of type laB diamonds”. Woods GS, Kiflawi I, Luyten W, Van Tendeloo G, Philosophical magazine letters 67, 405 (1993). http://doi.org/10.1080/09500839308240950
Abstract: It is shown that the infrared absorption spectra of pure type IaB diamonds, namely those that on cursory examination show only a B one-phonon component and neither A nor D, and the complete absence of a B' localized-mode platelet absorption peak, may be divided into two subgroups. The defect content of specimens of one of these subgroups has been studied before and comprises slip dislocations and voidites in random homogeneous distributions unconnected with the transformation of platelets to dislocation loops. Electron microscopy of a specimen of the other subgroup, which may be recognized by the presence of weak additional one-phonon absorption near 1100 cm-1, shows a population of dislocation loops resulting from the complete transformation of a former platelet population, plus accompanying voidites. It is suggested that the extra absorption is caused by the dislocation loops. Observation of the way in which loops and voidites are distributed suggests that voidite production and platelet transformation may not, after all, be interlinked phenomena, but parallel independent processes both promoted by the same unknown conditions.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.087
Times cited: 5
DOI: 10.1080/09500839308240950
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“Internal calibration technique for HREM studies of nanoscale particles”. Schryvers D, Goessens C, Safran G, Toth L, Microscopy research and technique
T2 –, JOINT MEETING OF DUTCH SOC FOR ELECTRON MICROSCOPY / BELGIAN SOC FOR, ELECTRON MICROSCOPY / BELGIAN SOC FOR CELL BIOLOGY, DEC 10-11, 1992, ANTWERP, BELGIUM 25, 185 (1993). http://doi.org/10.1002/jemt.1070250216
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.154
Times cited: 1
DOI: 10.1002/jemt.1070250216
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“Investigation by electron diffraction microscopy of (RE)BaCuOS polycrystalline ceramic compounds: interpretation of unexpected superstructures and influence of secondary phases”. Cloots R, Rulmont A, Krekels T, Van Tendeloo G, Diko P, Ausloos M, Journal of crystal growth 129, 394 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.698
Times cited: 5
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“A mercury based superconducting cuprate, intergrowth of the 2201 and 1201 structures Tl2HgBa4Cu2O10+y”. Martin C, Huvé, M, Van Tendeloo G, Maignan A, Michel C, Hervieu M, Raveau B, Physica: C : superconductivity 212, 274 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.942
Times cited: 21
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“Methods of structural analysis of modulated structures and quasicrystals”. van Landuyt J, Kuypers S, van Heurck C, Van Tendeloo G, Amelinckx S s.l., page 205 (1993).
Keywords: H3 Book chapter; Electron microscopy for materials research (EMAT)
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“Microtwin sequences in thermoelastic NixAl100-x martensite studied by conventional and high resolution transmission electron microscopy”. Schryvers D, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 68, 1017 (1993). http://doi.org/10.1080/01418619308219383
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 37
DOI: 10.1080/01418619308219383
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“Neutron and X-ray scattering cross sections of orientationally disordered solid C60”. Copley JRD, Michel KH, Journal Of Physics-Condensed Matter 5, 4353 (1993)
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 2.346
Times cited: 34
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“A new “1201&rdquo, mercury cuprate: the 27K-superconductor HG0.5Bi0.5Sr2-xLaxCuO5-\delta”. Pelloquin D, Michel C, Van Tendeloo G, Maignan A, Hervieu M, Raveau B, Physica: C : superconductivity 214, 87 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.942
Times cited: 62
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“A new “1212&rdquo, mercury-based 90K superconductor: (Hg1-xMx)O6+y”. Maignan A, Van Tendeloo G, Hervieu M, Michel C, Raveau B, Physica: C : superconductivity 212, 239 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.942
Times cited: 36
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“New 1212-type superconductors with a Tc up to 85K in the system Hg-Pr-Sr-Ca-Cu-O”. Hervieu M, Van Tendeloo G, Maignan A, Michel C, Goutenoire F, Raveau B, Physica: C : superconductivity 216, 264 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.942
Times cited: 66
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“New cation deficient perovskite-like oxides in the system La4Ti3O12-LaTiO3”. Bontchev R, Darriet B, Darriet J, Weill F, Van Tendeloo G, Amelinckx S, European journal of solid state and inorganic chemistry 30, 521 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 19
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“New mercury-based superconductors with the “1201&rdquo, structure Hg0.4Pr0.6Sr2-xPrxCuO4+\delta and Hg0.3Pb0.7Sr2-xLaxCuO4+\delta”. Goutenoire F, Daniel P, Hervieu M, Van Tendeloo G, Michel C, Maignan A, Raveau B, Physica: C : superconductivity 216, 243 (1993)
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 0.942
Times cited: 50
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“On the phase-like nature of the 7M structure in Ni-Al”. Schryvers D, Tanner LE, MRS Japan: shape memory materials 18, 849 (1993)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 1
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“On the relationship between morphology, composition and structure of Al-Cu-Fe crystals and quasicrystals”. Balzuweit K, Meekes H, Van Tendeloo G, de Boer JL, Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 67, 513 (1993). http://doi.org/10.1080/13642819308207689
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 10
DOI: 10.1080/13642819308207689
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“Order and disorder in (Nd,Ce)nO2nSr2GaCu2O5 and YSr2CoCu2O7”. Krekels T, Milat O, Van Tendeloo G, Amelinckx S, Babu TGN, Wright AJ, Greaves C, Journal of solid state chemistry 105, 313 (1993). http://doi.org/10.1006/jssc.1993.1222
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.133
Times cited: 50
DOI: 10.1006/jssc.1993.1222
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“Ordering principles for tetrahedral chains in Ga- and Co-substituted YBCO intergrowths”. Milat O, Krekels T, Van Tendeloo G, Amelinckx S, Journal de physique: 1: physique générale, physique statistique, matière condensée, domaines interdisciplinaires 3, 1219 (1993)
Abstract: A model for superstructure ordering in the <<chain>> layers of Ga (Co) substituted YBCO intergrowths with general formula (REO2)NSr2MCu2O5 (M = Co, Ga; n = 1, 2, ...) is proposed. By Ga or Co substitution for Cu, the structure of the <<chain>> layer changes : instead of the CuO4 planar squares, the chains consist of MO4 tetrahedra (M = Ga, Co) running along the [110] perovskite direction. The existing model for the Ga substituted <<123>> implies that all the chains are the same. Our new model is based on the results of Electron diffraction and High-resolution electron microscopy investigations. The model reveals the occurrence of two types of chains as a consequence of <<opposite>> ordering between neighbouring tetrahedra. The comer linked tetrahedra in each chain appear as alternatingly rotated in opposite sense, and a chain itself, as being displaced with respect to the underlying structure in one of two senses ; either forth (right) or back (left) along the chain direction. The regular alternation of chains of opposite type doubles the periodicity within a layer and induces the possibility for intrinsic disorder in the chain layer stacking sequence. The planar superstructure and a staggered stacking of the tetrahedral chain layers is found irrespective of the rest of the intergrowth structure. Superstructure ordering in the case of Co substitution is more perfect than for the Ga substitution.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 16
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“Radiation defects and ordered radiation patterns in Ni and Ni4Mo: a study by electron microscopy”. De Meulenaere P, Van Tendeloo G, van Landuyt J, Mommaert C, Severne G, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 67, 745 (1993). http://doi.org/10.1080/01418619308207187
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 1
DOI: 10.1080/01418619308207187
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“Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry”. Vanhellemont J, Maes HE, Schaekers M, Armigliato A, Cerva H, Cullis A, de Sande J, Dinges H, Hallais J, Nayar V, Pickering C, Stehlé, JL, Van Landuyt J, Walker C, Werner H, Salieri P;, Applied surface science
T2 –, SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE 63, 45 (1993). http://doi.org/10.1016/0169-4332(93)90062-G
Abstract: The main results and conclusions are presented of a round robin study of silicon oxide on silicon reference samples for ellipsometry. The oxide films with nominal thicknesses of 10, 50 and 120 nm are grown by thermal oxidation. The oxide film thicknesses have been determined by single wavelength ellipsometry (SWE), by spectroscopic ellipsometry (SE) and by cross-sectional conventional and high-resolution transmission electron microscopy (TEM and HREM) in different laboratories. The main conclusions are that special precautions have to be taken in order to use TEM as a reliable thickness measurement technique; that single wavelength ellipsometry can be used with great accuracy and reproducibility for the 50 and 120 nm film thicknesses but that it shows some inherent problems for the 10 nm films; and that spectroscopic ellipsometry showed for all film thicknesses an accuracy and reproducibility which is clearly superior to that of SWE.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.711
Times cited: 13
DOI: 10.1016/0169-4332(93)90062-G
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