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Author Van Aert, S.; van Dyck, D.
Title Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? Type A1 Journal article
Year (up) 2001 Publication Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties Abbreviated Journal
Volume 81 Issue 11 Pages 1833-1846
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication London Editor
Language Wos 000172199700016 Publication Date 2007-07-08
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1364-2812;1463-6417; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited 11 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:47519 Serial 744
Permanent link to this record
 
 
Author den Dekker, A.J.; Van Aert, S.; van Dyck, D.; van den Bos, A.; Geuens, P.
Title Does a monochromator improve the precision in quantitative HRTEM? Type A1 Journal article
Year (up) 2001 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 89 Issue Pages 275-290
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000172667000004 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 22 Open Access
Notes Approved Most recent IF: 2.843; 2001 IF: 1.890
Call Number UA @ lucian @ c:irua:47518 Serial 746
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Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; Van Dyck, D.
Title High resolution electron microscopy from imaging towards measuring Type H2 Book chapter
Year (up) 2001 Publication ... IEEE International Instrumentation and Measurement Technology Conference T2 – Rediscovering measurement in the age of informatics : proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC), 2001: vol 3 Abbreviated Journal
Volume Issue Pages 2081-2086
Keywords H2 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Ieee Place of Publication Editor
Language Wos Publication Date 2002-11-13
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN 0-7803-6646-8 Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:136870 Serial 4501
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Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.
Title High-resolution electron microscopy and electron tomography: resolution versus precision Type A1 Journal article
Year (up) 2002 Publication Journal of structural biology Abbreviated Journal J Struct Biol
Volume 138 Issue Pages 21-33
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication New York Editor
Language Wos 000177978800003 Publication Date 2002-09-17
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1047-8477; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.767 Times cited 33 Open Access
Notes Approved Most recent IF: 2.767; 2002 IF: 4.194
Call Number UA @ lucian @ c:irua:47520 Serial 1446
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Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.
Title High-resolution electron microscopy : from imaging toward measuring Type A1 Journal article
Year (up) 2002 Publication IEEE transactions on instrumentation and measurement Abbreviated Journal Ieee T Instrum Meas
Volume 51 Issue 4 Pages 611-615
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000178992000010 Publication Date 2003-01-03
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0018-9456; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.456 Times cited 13 Open Access
Notes Approved Most recent IF: 2.456; 2002 IF: 0.592
Call Number UA @ lucian @ c:irua:47521 Serial 1450
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Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.
Title Optimal experimental design of STEM measurement of atom column positions Type A1 Journal article
Year (up) 2002 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 90 Issue Pages 273-289
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000174770900004 Publication Date 2002-07-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 35 Open Access
Notes Approved Most recent IF: 2.843; 2002 IF: 1.772
Call Number UA @ lucian @ c:irua:47517 Serial 2483
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Author van Dyck, D.; Van Aert, S.; den Dekker, A.J.; van den Bos, A.
Title Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures? Type A1 Journal article
Year (up) 2003 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 98 Issue Pages 27-42
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000186831500003 Publication Date 2003-04-25
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 26 Open Access
Notes Approved Most recent IF: 2.843; 2003 IF: 1.665
Call Number UA @ lucian @ c:irua:47516 Serial 1749
Permanent link to this record
 
 
Author Rosenauer, A.; Gerthsen, D.; Van Aert, S.; van Dyck, D.; den Dekker, A.J.
Title Present state of the composition evaluation of ternary semiconductor nanostructures by lattice fringe analysis Type A1 Journal article
Year (up) 2003 Publication Institute of physics conference series Abbreviated Journal
Volume Issue 180 Pages 19-22
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract Semiconductor heterostructures are used for the fabrication of optoelectronic devices. Performance of such devices is governed by their chemical morphology. The composition distribution of quantum wells and dots is influenced by kinetic growth processes which are not understood completely at present. To obtain more information about these effects, methods for composition determination with a spatial resolution at a near atomic scale are necessary. In this paper we focus on the present state of the composition evaluation by the lattice fringe analysis (CELFA) technique and explain the basic ideas, optimum imaging conditions, precision and accuracy.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0-7503-0979-2 ISBN Additional Links UA library record; WoS full record;
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:95118 Serial 2710
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.
Title How to optimize the experimental design of quantitative atomic resolution TEM experiments? Type A1 Journal article
Year (up) 2004 Publication Micron Abbreviated Journal Micron
Volume 35 Issue Pages 425-429
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000221721000005 Publication Date 2004-03-06
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0968-4328; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.98 Times cited 14 Open Access
Notes Approved Most recent IF: 1.98; 2004 IF: 1.464
Call Number UA @ lucian @ c:irua:47514 Serial 1495
Permanent link to this record
 
 
Author Verbeeck, J.; Van Aert, S.
Title Model based quantification of EELS spectra Type A1 Journal article
Year (up) 2004 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 101 Issue 2/4 Pages 207-224
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract Recent advances in model based quantification of electron energy loss spectra (EELS) are reported. The maximum likelihood method for the estimation of physical parameters describing an EELS spectrum, the validation of the model used in this estimation procedure, and the computation of the attainable precision, that is, the theoretical lower bound on the variance of these estimates, are discussed. Experimental examples on An and GaAs samples show the power of the maximum likelihood method and show that the theoretical prediction of the attainable precision can be closely approached even for spectra with overlapping edges where conventional EELS quantification fails. To provide end-users with a low threshold alternative to conventional quantification, a user friendly program was developed which is freely available under a GNU public license. (C) 2004 Elsevier B.V. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000224046100016 Publication Date 2004-07-23
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 147 Open Access
Notes Fwo; Iuap P5/01 Approved Most recent IF: 2.843; 2004 IF: 2.215
Call Number UA @ lucian @ c:irua:57130UA @ admin @ c:irua:57130 Serial 2101
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Author van Dyck, D.; Van Aert, S.; den Dekker, A.J.
Title Physical limits on atomic resolution Type A1 Journal article
Year (up) 2004 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal
Volume 10 Issue Pages 153-157
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos 000188882100022 Publication Date 2004-08-11
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.891 Times cited 14 Open Access
Notes Approved Most recent IF: 1.891; 2004 IF: 2.389
Call Number UA @ lucian @ c:irua:47515 Serial 2616
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Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.
Title Statistical experimental design for quantitative atomic resolution transmission electron microscopy Type H1 Book chapter
Year (up) 2004 Publication Abbreviated Journal Adv Imag Elect Phys
Volume Issue Pages 1-164
Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Academic Press Place of Publication San Diego, Calif. Editor
Language Wos 000223226700001 Publication Date 2011-01-05
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1076-5670; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor Times cited 13 Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:47513 Serial 3156
Permanent link to this record
 
 
Author den Dekker, A.J.; Van Aert, S.; van den Bos, A.; van Dyck, D.
Title Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework Type A1 Journal article
Year (up) 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 104 Issue 2 Pages 83-106
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000230526400001 Publication Date 2005-04-09
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 70 Open Access
Notes Approved Most recent IF: 2.843; 2005 IF: 2.490
Call Number UA @ lucian @ c:irua:57229 Serial 1959
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van den Bos, A.; van Dyck, D.; Chen, J.H.
Title Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example Type A1 Journal article
Year (up) 2005 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 104 Issue 2 Pages 107-125
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000230526400002 Publication Date 2005-04-08
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 37 Open Access
Notes Approved Most recent IF: 2.843; 2005 IF: 2.490
Call Number UA @ lucian @ c:irua:57131 Serial 1960
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; Croitoru, M.D.
Title Obstacles on the road towards atomic resolution tomography Type A3 Journal article
Year (up) 2005 Publication Microscoy and microanalysis Abbreviated Journal
Volume 11 Issue S2 Pages 238-239
Keywords A3 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:57129 Serial 2426
Permanent link to this record
 
 
Author Bals, S.; Van Aert, S.; Van Tendeloo, G.; van Dyck, D.; Avila-Brande, D.
Title Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction Type A3 Journal article
Year (up) 2005 Publication Microscopy and microanalysis Abbreviated Journal
Volume 11 Issue S Pages 556-557
Keywords A3 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:54881 Serial 3155
Permanent link to this record
 
 
Author van Dyck, D.; Van Aert, S.; Croitoru, M.
Title Atomic resolution electron tomography: a dream? Type A1 Journal article
Year (up) 2006 Publication International journal of materials research Abbreviated Journal Int J Mater Res
Volume 97 Issue 7 Pages 872-879
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000239916700003 Publication Date 2013-12-09
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1862-5282;2195-8556; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 0.681 Times cited 6 Open Access
Notes Approved Most recent IF: 0.681; 2006 IF: NA
Call Number UA @ lucian @ c:irua:60965 Serial 176
Permanent link to this record
 
 
Author Croitoru, M.D.; van Dyck, D.; Van Aert, S.; Bals, S.; Verbeeck, J.
Title An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images Type A1 Journal article
Year (up) 2006 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 106 Issue 10 Pages 933-940
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab
Abstract We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000240397200006 Publication Date 2006-05-10
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 18 Open Access
Notes Fwo; Fwo-V Approved Most recent IF: 2.843; 2006 IF: 1.706
Call Number UA @ lucian @ c:irua:87604UA @ admin @ c:irua:87604 Serial 876
Permanent link to this record
 
 
Author Huijben, M.; Rijnders, G.; Blank, D.H.A.; Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.; Brinkman, A.; Hilgenkamp, H.
Title Electronically coupled complementary interfaces between perovskite band insulators Type A1 Journal article
Year (up) 2006 Publication Nature materials Abbreviated Journal Nat Mater
Volume 5 Issue Pages 556-560
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication London Editor
Language Wos 000238708900021 Publication Date 2006-06-18
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1476-1122;1476-4660; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 39.737 Times cited 315 Open Access
Notes Fwo Approved Most recent IF: 39.737; 2006 IF: 19.194
Call Number UA @ lucian @ c:irua:59713UA @ admin @ c:irua:59713 Serial 1019
Permanent link to this record
 
 
Author Verbeeck, J.; Van Aert, S.; Bertoni, G.
Title Model-based quantification of EELS spectra: including the fine structure Type A1 Journal article
Year (up) 2006 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 106 Issue 11-12 Pages 976-980
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract An extension to model-based electron energy loss spectroscopy (EELS) quantification is reported to improve the possibility of modelling fine structure changes in electron energy loss spectra. An equalisation function is used in the energy loss near edge structure (ELNES) region to model the differences between a single atom differential cross section and the cross section for an atom in a crystal. The equalisation function can be shown to approximate the relative density of unoccupied states for the given excitation edge. On a set of 200 experimental h-BN spectra, this technique leads to statistically acceptable models resulting into unbiased estimates of relative concentrations and making the estimated precisions come very close to the Cramer-Rao lower bound (CRLB). The method greatly expands the useability of model-based EELS quantification to spectra with pronounced fine structure. Another benefit of this model is that one also gets an estimate of the unoccupied density of states for a given excitation edge, without having to do background removal and deconvolution, making the outcome intrinsically more reliable and less noisy. (c) 2006 Elsevier B.V. All rights reserved.
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000241592900004 Publication Date 2006-07-04
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 38 Open Access
Notes Goa; Fwo Iap-V Approved Most recent IF: 2.843; 2006 IF: 1.706
Call Number UA @ lucian @ c:irua:61379UA @ admin @ c:irua:61379 Serial 2102
Permanent link to this record
 
 
Author Van Aert, S.; van Dyck, D.; den Dekker, A.J.
Title Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative Type A1 Journal article
Year (up) 2006 Publication Optics express Abbreviated Journal Opt Express
Volume 14 Issue 9 Pages 3830-3839
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Wos 000237296200013 Publication Date 2006-05-04
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1094-4087; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 3.307 Times cited 45 Open Access
Notes Fwo Approved Most recent IF: 3.307; 2006 IF: 4.009
Call Number UA @ lucian @ c:irua:58262 Serial 2883
Permanent link to this record
 
 
Author Bals, S.; Van Aert, S.; Van Tendeloo, G.; Avila-Brande, D.
Title Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range Type A1 Journal article
Year (up) 2006 Publication Physical review letters Abbreviated Journal Phys Rev Lett
Volume 96 Issue 9 Pages 096106,1-4
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract The local structure of Bi4W2/3Mn1/3O8Cl is determined using quantitative transmission electron microscopy. The electron exit wave, which is closely related to the projected crystal potential, is reconstructed and used as a starting point for statistical parameter estimation. This method allows us to refine all atomic positions on a local scale, including those of the light atoms, with a precision in the picometer range. Using this method one is no longer restricted to the information limit of the electron microscope. Our results are in good agreement with x-ray powder diffraction data demonstrating the reliability of the method. Moreover, it will be shown that local effects can be interpreted using this approach.
Address
Corporate Author Thesis
Publisher Place of Publication New York, N.Y. Editor
Language Wos 000235905700042 Publication Date 2006-03-10
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0031-9007;1079-7114; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 8.462 Times cited 69 Open Access
Notes Fwo; Iap V Approved Most recent IF: 8.462; 2006 IF: 7.072
Call Number UA @ lucian @ c:irua:56977 Serial 3154
Permanent link to this record
 
 
Author Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R.
Title Electron channelling based crystallography Type A1 Journal article
Year (up) 2007 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 107 Issue 6/7 Pages 551-558
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000245341300015 Publication Date 2006-12-13
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 32 Open Access
Notes Approved Most recent IF: 2.843; 2007 IF: 1.996
Call Number UA @ lucian @ c:irua:64286 Serial 913
Permanent link to this record
 
 
Author Van Aert, S.
Title Meer zien met onzichtbaar licht Type A2 Journal article
Year (up) 2007 Publication Karakter : tijdschrift van wetenschap Abbreviated Journal
Volume 18 Issue Pages 19-21
Keywords A2 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Leuven Editor
Language Wos Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1379-0390 ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:68658 Serial 1982
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.
Title The notion of resolution Type H3 Book chapter
Year (up) 2007 Publication Abbreviated Journal
Volume Issue Pages 1228-1265
Keywords H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Springer Place of Publication Berlin Editor
Language Wos Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:68657 Serial 2371
Permanent link to this record
 
 
Author Bals, S.; Van Aert, S.; Verbeeck, J.; Van Tendeloo, G.
Title Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy Type A1 Journal article
Year (up) 2007 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal
Volume 13 Issue S:3 Pages 332-333
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos Publication Date 2008-02-13
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record
Impact Factor 1.891 Times cited Open Access
Notes Approved Most recent IF: 1.891; 2007 IF: 1.941
Call Number UA @ lucian @ c:irua:96553 Serial 3224
Permanent link to this record
 
 
Author Van Aert, S.; den Dekker, A.J.; van Dyck, D.; van den Bos, A.
Title The notion of resolution Type H3 Book chapter
Year (up) 2008 Publication Abbreviated Journal
Volume Issue Pages 1228-1265
Keywords H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Springer Place of Publication Berlin Editor
Language Wos Publication Date 0000-00-00
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:68656 Serial 2370
Permanent link to this record
 
 
Author Van Aert, S.; Bals, S.; Chang, L.Y.; den Dekker, A.J.; Kirkland, A.I.; Van Dyck, D.; Van Tendeloo, G.
Title The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data Type H1 Book chapter
Year (up) 2008 Publication Abbreviated Journal
Volume Issue Pages 97-98
Keywords H1 Book chapter; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Springer Place of Publication Berlin Editor
Language Wos Publication Date 2009-03-17
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN ISBN 978-3-540-85154-7 Additional Links UA library record
Impact Factor Times cited Open Access
Notes Approved Most recent IF: NA
Call Number UA @ lucian @ c:irua:136865 Serial 4493
Permanent link to this record
 
 
Author Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G.
Title Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy Type A1 Journal article
Year (up) 2009 Publication Microscopy and microanalysis Abbreviated Journal Microsc Microanal
Volume 15 Issue S:2 Pages 464-465
Keywords A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Abstract
Address
Corporate Author Thesis
Publisher Place of Publication Cambridge, Mass. Editor
Language Wos 000208119100230 Publication Date 2009-07-27
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1431-9276;1435-8115; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 1.891 Times cited 1 Open Access
Notes Approved Most recent IF: 1.891; 2009 IF: 3.035
Call Number UA @ lucian @ c:irua:96555UA @ admin @ c:irua:96555 Serial 178
Permanent link to this record
 
 
Author Van Aert, S.; Chang, L.Y.; Bals, S.; Kirkland, A.I.; Van Tendeloo, G.
Title Effect of amorphous layers on the interpretation of restored exit waves Type A1 Journal article
Year (up) 2009 Publication Ultramicroscopy Abbreviated Journal Ultramicroscopy
Volume 109 Issue 3 Pages 237-246
Keywords A1 Journal article; Electron microscopy for materials research (EMAT)
Abstract The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.
Address
Corporate Author Thesis
Publisher Place of Publication Amsterdam Editor
Language Wos 000264280200005 Publication Date 2008-11-15
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0304-3991; ISBN Additional Links UA library record; WoS full record; WoS citing articles
Impact Factor 2.843 Times cited 10 Open Access
Notes Fwo; Esteem 026019 Approved Most recent IF: 2.843; 2009 IF: 2.067
Call Number UA @ lucian @ c:irua:76421 Serial 796
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