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  Author Title Year Publication Volume (up) Times cited Additional Links Links
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; van Landuyt, J.; Simoen, E.; Claeys, C. Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy 2002 UA library record; WoS full record;
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. Clustering of vacancies on {113} planes in Si layers close to Si-Si3N4 interfaces and further aggregation of self-interstitials inside vacancy clusters during electron irradiation 1999 Institute of physics conference series T2 – Conference on Microscopy of Semiconducting Materials, MAR 22-25, 1999, UNIV OXFORD, OXFORD, ENGLAND UA library record; WoS full record;
Schryvers, D.; Goessens, C.; van Renterghem, W.; van Landuyt, J.; de Keyzer, R. Conventional and HREM study of structural defects in nanostructured silver halides 1998 UA library record
Raveau, B.; Hervieu, M.; Michel, C.; Martin, C.; Maignan, A.; Van Tendeloo, G. Crystal chemistry of mercury based layered cuprates and oxycarbonates 1995 UA library record
Lebedev, O.; Van Tendeloo, G.; Marezio, M.; Licci, F.; Gilioli, E.; Gauzzi, A.; Prodi, A. The crystal structure of YSr2Cu3O6+x determined by HREM 2002 UA library record
Tarakina, N.V.; Zubkov, V.G.; Leonidov, I.I.; Tyutunnik, A.P.; Surat, L.L.; Hadermann, J.; Van Tendeloo, G. Crystal structure of the group of optical materials Ln2MeGe4O12 (Me = Ca, Mn) 2009 Zeitschrift für Kristallographie 7 UA library record; WoS full record; WoS citing articles doi
Joutsensaari, J.; Ahonen, P.P.; Tapper, U.; Kauppinen, E.I.; Pauwels, B.; Amelinckx, S.; Van Tendeloo, G. Crystallization of fullerene nanopraticles in an aerosol flow reactor 1999 UA library record
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. DART explained: how to carry out a discrete tomography reconstruction 2008 UA library record
Schryvers, D.; Seo, J.W.; Richard, O.; Vermeulen, W.; Potapov, P. Decomposition phenomena in Ni-Mn-Ti austenite 1999 UA library record; WoS full record;
Van Renterghem, W.; Schryvers, D.; van Landuyt, J.; Bollen, D.; Van Roost, C.; De Keyzer, R.B. Defect induced thickness growth in silver chloride (111) tabular crystals: a TEM study 2000 UA library record; WoS full record;
van Renterghem, W.; Schryvers, D.; van Landuyt, J.; van Roost, C. Defect related growth of tabular AgCl(100) crystals: a TEM study 1998 UA library record; WoS full record;
Van Tendeloo, G.; Hervieu, M.; Chaillout, C. Defect structure of Hg-based ceramic superconductors (invited) 1994 Sciences UA library record; WoS full record;
van Renterghem, W.; Goessens, C.; Schryvers, D.; van Landuyt, J.; Verrept, P.; Bollen, D.; van Roost, C.; de Keyzer, R. Defects in AgCl and AgBr(100) tabular crystals studied by TEM 1998 UA library record
Blumenau, A.T.; Frauenheim, T.; Öberg, S.; Willems, B.; Van Tendeloo, G. Dislocation structures in diamond: density-functional based modelling and high resolution electron microscopy 2004 UA library record; WoS full record; WoS citing articles pdf
Muto, S.; Merk, N.; Schryvers, D.; Tanner, L.E. Displacive and diffusive components in the formation of the Ni2Al structure studied by HREM, SAED and micro-ED 1992 Monterey Institute for Advances Studies UA library record
Peirs, J.; Verleysen, P.; Tirry, W.; Rabet, L.; Schryvers, D.; Degrieck, J. Dynamic shear localization in Ti6Al4V 2011 Procedia Engineering T2 – 11th International Conference on the Mechanical Behavior of Materials, (ICM), 2011, Como, ITALY (ICM11) 4 UA library record; WoS full record; WoS citing articles doi
E. Zaghi, A.; Buffière, M.; Koo, J.; Brammertz, G.; Batuk, M.; Verbist, C.; Hadermann, J.; Kim, W.K.; Meuris, M.; Poortmans, J.; Vleugels, J.; Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment 2014 Thin solid films : an international journal on the science and technology of thin and thick films 7 UA library record; WoS full record; WoS citing articles pdf doi
Hens, S.; Bender, H.; Donaton, R.A.; Maex, K.; Vanhaelemeersch, S.; van Landuyt, J. EFTEM study of plasma etched low-k Si-O-C dielectrics 2001 Institute of physics conference series T2 – Royal-Microscopical-Society Conference on Microscopy of Semiconducting, Materials, MAR 25-29, 2001, UNIV OXFORD, OXFORD, ENGLAND UA library record; WoS full record;
Colomer, J.-F.; Van Tendeloo, G. Electron diffraction and microscopy of single-walled carbon nanotube bundles 2003 UA library record
Colomer, J.-F.; Henrard, L.; Lambin, P.; Van Tendeloo, G. Electron diffraction of nanotubes bundles : unique helicity and tube-tube atomically coherent packing 2002 AIP conference proceedings T2 – 16th International Winterschool on Electronic Properties of Novel, Materials, MAR 02-09, 2002, KIRCHBERG, AUSTRIA UA library record; WoS full record pdf doi
Lu, Y. Electron energy-loss spectroscopy (EELS) characterization of diamond and related materials 2013 UA library record
Amelinckx, S.; Nistor, L.C.; Van Tendeloo, G. Electron microscopic study of long period ordering in complex oxides 1994 UA library record
Van Tendeloo, G.; Amelinckx, S. Electron-microscopy and the structural studies of superconducting materials and fullerites 1994 NATO Advanced Study Institutes series: series E : applied sciences T2 – NATO Advanced Study Institute on Materials and crystallographic Aspects, of HT(c)-Superconductivity, May 17-30, 1993, Erice, Italy UA library record; WoS full record;
Van Tendeloo, G.; van Landuyt, J.; Amelinckx, S. Electron microscopy of fullerenes and fullerene related structures 1994 UA library record
Van Tendeloo, G.; Amelinckx, S. Electron microscopy of fullerenes and related materials 2000 UA library record
Van Tendeloo, G.; Goessens, C.; Schryvers, D.; van Haverbergh, J.; de Veirman, A.; van Landuyt, J. Electron microscopy of interfaces in new materials 1991 UA library record
Van Tendeloo, G.; Amelinckx, S. Electron microscopy of C60 and C70 fullerites 1993 UA library record
Pauwels, B.; Van Tendeloo, G.; Joutsensaari, J.; Kauppinen, E.I. Electron microscopy on nanoparticles: structure of C60 and C70 nanopraticles 1999 UA library record
Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. Electron microscopy: principles and fundamentals 1997 UA library record
Seo, J.W.; Schryvers, D.; Potapov, P. Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 1998 UA library record; WoS full record;
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