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Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
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Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography”. Kruse P, Schowalter M, Lamoen D, Rosenauer A, Gerthsen D, Ultramicroscopy 106, 105 (2006). http://doi.org/10.1016/j.ultramic.2005.06.057
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Nonlinear imaging using annular dark field TEM”. Bals S, Kilaas R, Kisielowski C, Ultramicroscopy 104, 281 (2005). http://doi.org/10.1016/j.ultramic.2005.05.004
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Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D, Chen JH, Ultramicroscopy 104, 107 (2005). http://doi.org/10.1016/j.ultramic.2005.03.002
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Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework”. den Dekker AJ, Van Aert S, van den Bos A, van Dyck D, Ultramicroscopy 104, 83 (2005). http://doi.org/10.1016/j.ultramic.2005.03.001
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Plasmon holographic experiments: theoretical framework”. Verbeeck J, van Dyck D, Lichte H, Potapov P, Schattschneider P, Ultramicroscopy 102, 239 (2005). http://doi.org/10.1016/j.ultramic.2004.10.005
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Model based quantification of EELS spectra”. Verbeeck J, Van Aert S, Ultramicroscopy 101, 207 (2004). http://doi.org/10.1016/j.ultramic.2004.06.004
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Optical and photoelectrical properties of nanocrystalline indium oxide with small grains”. Forsh EA, Abakumov AM, Zaytsev VB, Konstantinova EA, Forsh PA, Rumyantseva MN, Gaskov AM, Kashkarov PK, Thin solid films : an international journal on the science and technology of thin and thick films 595, 25 (2015). http://doi.org/10.1016/j.tsf.2015.10.053
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Effect of the burn-out step on the microstructure of the solution-processed Cu(In,Ga)Se2 solar cells”. Batuk M, Buffiere M, Zaghi AE, Lenaers N, Verbist C, Khelifi S, Vleugels J, Meuris M, Hadermann J, Thin solid films : an international journal on the science and technology of thin and thick films 583, 142 (2015). http://doi.org/10.1016/j.tsf.2015.03.063
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Thermal conductivity of titanium nitride/titanium aluminum nitride multilayer coatings deposited by lateral rotating cathode arc”. Samani MK, Ding XZ, Khosravian N, Amin-Ahmadi B, Yi Y, Chen G, Neyts EC, Bogaerts A, Tay BK, Thin solid films : an international journal on the science and technology of thin and thick films 578, 133 (2015). http://doi.org/10.1016/j.tsf.2015.02.032
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Effect of selenium content of CuInSex alloy nanopowder precursors on recrystallization of printed CuInSe2 absorber layers during selenization heat treatment”. E Zaghi A, Buffière M, Koo J, Brammertz G, Batuk M, Verbist C, Hadermann J, Kim WK, Meuris M, Poortmans J, Vleugels J;, Thin solid films : an international journal on the science and technology of thin and thick films , 1 (2014). http://doi.org/10.1016/j.tsf.2014.10.003
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Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films”. Amin-Ahmadi B, Idrissi H, Galceran M, Colla MS, Raskin JP, Pardoen T, Godet S, Schryvers D, Thin solid films : an international journal on the science and technology of thin and thick films 539, 145 (2013). http://doi.org/10.1016/j.tsf.2013.05.083
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The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg―Y―O thin films”. Jehanathan N, Georgieva V, Saraiva M, Depla D, Bogaerts A, Van Tendeloo G, Thin solid films : an international journal on the science and technology of thin and thick films 519, 5388 (2011). http://doi.org/10.1016/j.tsf.2011.02.050
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Metal-decorated multi-wall carbon nanotubes for low temperature gas sensing”. Espinosa EH, Lonescu R, Bittencourt C, Felten A, Erni R, Van Tendeloo G, Pireaux J-J, Llobet E, Thin solid films : an international journal on the science and technology of thin and thick films 515, 8322 (2007). http://doi.org/10.1016/j.tsf.2007.03.017
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Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering”. Laffez P, Chen XY, Banerjee G, Pezeril T, Rossell MD, Van Tendeloo G, Lacorre P, Liu JM, Liu Z-G, Thin solid films : an international journal on the science and technology of thin and thick films 500, 27 (2006). http://doi.org/10.1016/j.tsf.2005.10.062
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Influence of the Ar/O2 ratio on the growth and biaxial alignment of yttria stabilized zirconia layers during reactive unbalanced magnetron sputtering”. Mahieu S, Ghekiere P, de Winter G, Depla D, de Gryse R, Lebedev OI, Van Tendeloo G, Thin solid films : an international journal on the science and technology of thin and thick films 484, 18 (2005). http://doi.org/10.1016/j.tsf.2005.01.021
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Metallic nanoparticles on plasma treated carbon nanotubes : $Nano2hybrids$”. Bittencourt C, Felten A, Douhard B, Colomer J-F, Van Tendeloo G, Drube W, Ghijsen J, Pireaux J-J, Surface science : a journal devoted to the physics and chemistry of interfaces T2 –, International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE 601, 2800 (2007). http://doi.org/10.1016/j.susc.2006.12.045
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CdSe quantum dot formation induced by amorphous Se”. Aichele T, Robin I-C, Bougerol C, André, R, Tatarenko S, Van Tendeloo G, Surface science : a journal devoted to the physics and chemistry of interfaces T2 –, International Conference on NANO-Structures Self Assembling, JUL 02-06, 2006, Aix en Provence, FRANCE 601, 2664 (2007). http://doi.org/10.1016/j.susc.2006.12.001
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Microstructure and defect characterization at interfaces in TiN/CrN multilayer coatings”. Major L, Tirry W, Van Tendeloo G, Surface and coatings technology 202, 6075 (2008). http://doi.org/10.1016/j.surfcoat.2008.07.005
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Crystallographic aspects related to advanced tribological multilayers of Cr/CrN and Ti/TiN types produced by pulsed laser deposition (PLD)”. Major L, Morgiel J, Major B, Lackner JM, Waldhauser W, Ebner R, Nistor L, Van Tendeloo G, Surface and coatings technology 200, 6190 (2006). http://doi.org/10.1016/j.surfcoat.2005.11.021
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Biaxially aligned titanium nitride thin films deposited by reactive unbalanced magnetron sputtering”. Mahieu S, Ghekiere P, de Winter G, de Gryse R, Depla D, Van Tendeloo G, Lebedev OI, Surface and coatings technology 200, 2764 (2006). http://doi.org/10.1016/j.surfcoat.2004.09.012
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Microstructure and high temperature transport properties of high quality epitaxial SrFeO3-\delta films”. Solís C, Rossell MD, Garcia G, Figueras A, Van Tendeloo G, Santiso J, Solid state ionics 179, 1996 (2008). http://doi.org/10.1016/j.ssi.2008.06.004
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Synthesis and characterization of oxygen-deficient oxides BaCo1-xYxO3-y' x = 0.15, 0.25 and 0.33, with the perovskite structure”. Lomakov MV, Istomin SY, Abakumov AM, Van Tendeloo G, Antipov EV, Solid state ionics 179, 1885 (2008). http://doi.org/10.1016/j.ssi.2008.05.004
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Thickness-dependent transport properties of Sr4Fe6O13 epitaxial thin films”. Pardo JA, Santiso J, Solis C, Garcia G, Figueras A, Rossell MD, Solid state ionics 177, 423 (2006). http://doi.org/10.1016/J.SSI.2005.11.024
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Bi0.75Sr0.25FeO3-\delta : revealing order/disorder phenomena by combining diffraction techniques”. Pachoud E, Bréard Y, Martin C, Maignan A, Abakumov AM, Suard E, Smith RI, Suchomel MR, Solid state communications 152, 331 (2012). http://doi.org/10.1016/j.ssc.2011.12.023
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X-ray and electron spectroscopy investigation of the coreshell nanowires of ZnO:Mn”. Guda AA, Smolentsev N, Verbeeck J, Kaidashev EM, Zubavichus Y, Kravtsova AN, Polozhentsev OE, Soldatov AV, Solid state communications 151, 1314 (2011). http://doi.org/10.1016/j.ssc.2011.06.028
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Effects of nanocracks on the magnetic and electrical properties of La0.8Sr0.2MnO3 single crystals”. Dominiczak M, Ruyter A, Limelette P, Monot-Laffez I, Giovannelli F, Rossell MD, Van Tendeloo G, Solid state communications 149, 1543 (2009). http://doi.org/10.1016/j.ssc.2009.06.001
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Relaxation phenomena at the metal-to-insulator transition in La0.8Sr0.2MnO3 single crystals”. Dominiczak M, Ruyter A, Limelette P, Monot-Laffez I, Giovannelli F, Rossell MD, Van Tendeloo G, Solid state communications 148, 340 (2008). http://doi.org/10.1016/j.ssc.2008.08.029
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Quantum transport in an ultra-thin SOI MOSFET: influence of the channel thickness on the I-V characteristics”. Croitoru MD, Gladilin VN, Fomin VM, Devreese JT, Magnus W, Schoenmaker W, Sorée B, Solid state communications 147, 31 (2008). http://doi.org/10.1016/j.ssc.2008.04.025
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Critical temperature modification of low dimensional superconductors by spin doping”. Jalkanen P, Tuboltsev V, Virtanen A, Arutyunov K, Räisänen J, Lebedev O, Van Tendeloo G, Solid state communications 142, 407 (2007). http://doi.org/10.1016/j.ssc.2007.03.011
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