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Author |
Title |
Year |
Publication  |
Volume |
Times cited |
Additional Links |
Links |
|
|
Jochum, K.P.; Gijbels, R.; Adriaens, A. |
Multielementmassenspektrometrie (MMS) |
2000 |
|
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|
UA library record |
|
|
|
Bogaerts, A.; Gijbels, R. |
Numerical modelling of analytical glow discharges |
2003 |
|
|
|
UA library record |
|
|
|
Madani, M.; Bogaerts, A.; Gijbels, R.; Vangeneugden, D. |
Parametric study by means of numerical modelling for a dielectric barrier discharge at atmospheric pressure in nitrogen |
2004 |
|
|
|
UA library record |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Photographic materials |
2001 |
|
|
|
UA library record |
|
|
|
Remond, G.; Gijbels, R.; Levenson, L.L.; Shimizu, R. |
Physics of generation and detection of signals used for microcharacterization |
1994 |
|
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|
UA library record |
|
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|
Bogaerts, A.; Gijbels, R. |
Plasma models |
1997 |
|
|
|
UA library record |
|
|
|
Shazali, I.; Van 't dack, L.; Gijbels, R. |
Preconcentration of precious metals by tellurium sulphide fire-assay followed by instrumental neutron activation analysis |
1988 |
|
|
|
UA library record |
|
|
|
de Vyt, A.; Gijbels, R.; van Roost, C.; Geuens, I. |
Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1 |
1998 |
|
|
|
UA library record |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I. |
Quantitative SIMS analysis of surface layers of cubic silver halide microcrystals: comparison of different quantification methods |
1998 |
|
|
|
UA library record |
|
|
|
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
1996 |
|
|
|
UA library record |
|
|
|
Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry |
1996 |
|
|
|
UA library record |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. |
Reduction of composite Ag(Br,I) grains as studied by AEM and digital image analysis techniques |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
|
Gijbels, R.; Oleshko, V. |
Scanning microanalysis |
1998 |
|
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|
UA library record |
|
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|
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
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|
UA library record |
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Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1997 |
|
|
|
UA library record |
|
|
|
Oleshko, V.; Gijbels, R. |
Scanning microanalysis |
1996 |
|
|
|
UA library record |
|
|
|
Baguer, N.; Bogaerts, A.; Gijbels, R. |
A self-consistent mathematical model of a hollow cathode glow discharge |
1999 |
|
|
|
UA library record; WoS full record; |
|
|
|
Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Herrebout, D.; Bogaerts, A.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. |
Simulation of plasma processes in plasma assisted CVD reactors |
1999 |
|
|
|
UA library record; WoS full record; |
|
|
|
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A.; van Daele, A.J. |
Structural and analytical characterization of composite tabular silver halide microcrystals by cryo-EFTEM/EELS and cryo-STEM/EDX techniques |
1998 |
|
|
|
UA library record |
|
|
|
van Vaeck, L.; van Roy, W.; Gijbels, R.; Adams, F. |
Structural characterization of organic molecules by laser mass spectrometry |
1993 |
|
|
|
UA library record |
|
|
|
Martin, J.M.L.; François, J.P.; Gijbels, R.; Almlöf, J. |
Structure and infrared spectroscopy of the C11 molecule |
1991 |
|
|
|
UA library record |
|
|
|
Oleshko, V.P.; van Daele, A.J.; Gijbels, R.H.; Jacob, W.A. |
Study of electron excitations in Ag(Br,I) nanocrystals by cryo-AEM techniques |
1998 |
|
|
|
UA library record; WoS full record; |
|
|
|
de Witte, H.; Conard, T.; Vandervorst, W.; Gijbels, R. |
Study of oxynitrides with dual beam TOF-SIMS |
2000 |
|
|
|
UA library record |
|
|
|
Verlinden, G.; Gijbels, R.; Geuens, I.; de Keyzer, R. |
Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1998 |
|
|
|
UA library record |
|
|
|
Verlinden, G.; Gijbels, R.; Brox, O.; Benninghoven, A.; Geuens, I.; de Keyzer, R. |
Surface analysis of silver halide microcrystals by imaging time-of-flight SIMS (TOF-SIMS) |
1997 |
|
|
|
UA library record; WoS full record; |
|
|
|
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
A temperature study of mixed AgBr-AgBrI tabular crystals |
1995 |
|
|
3 |
UA library record; WoS full record; WoS citing articles |
|
|
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Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
A temperature study of mixed AgBr-AgBrI tabular crystals |
1992 |
|
|
|
UA library record |
|
|
|
Lenaerts, J.; Verlinden, G.; Gijbels, R.; Geuens, I.; Callant, P. |
The exchange of fluorinated dyes between different types of silver halide microcrystals studied by time of flight secondary ion mass spectrometry (TOF-SIMS) |
2000 |
|
|
|
UA library record; WoS full record; |
|
|
|
Lenaerts, J.; Verlinden, G.; van Vaeck, L.; Gijbels, R.; Geuens, I. |
TOF-SIMS analysis of carbocyanine dyes adsorbed on silver substrates |
2000 |
|
|
|
UA library record |
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