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2014 Award for best referee of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 311 (2014). http://doi.org/10.1002/XRS.2564
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Application of auxiliary signals in X-ray fluorescence and electron microprobe analysis for density evaluation”. Kuczumov A, Vekemans B, Schalm O, Vincze L, Dorriné, W, Gysels K, Van Grieken R, X-ray spectrometry 28, 282 (1999). http://doi.org/10.1002/(SICI)1097-4539(199907/08)28:4<282::AID-XRS352>3.0.CO;2-H
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Assessment of aerosol particles within the Rubens' House Museum in Antwerp, Belgium”. Godoi RHM, Potgieter-Vermaak S, Godoi AFL, Stranger M, Van Grieken R, X-ray spectrometry 37, 298 (2008). http://doi.org/10.1002/XRS.1049
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Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution”. Van Dyck P, Van Grieken R, X-ray spectrometry 12, 111 (1983). http://doi.org/10.1002/XRS.1300120306
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Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 9, 70 (1980). http://doi.org/10.1002/XRS.1300090209
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Awards for best referees of X-ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 68 (2014). http://doi.org/10.1002/XRS.2530
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Comparison of x-ray absorption and emission techniques for the investigation of paintings”. Cabal A, Schalm O, Eyskens P, Willems P, Harth A, van Espen P, X-ray spectrometry 44, 141 (2015). http://doi.org/10.1002/XRS.2591
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Comprehensive microanalytical study of welding aerosols with x-ray and Raman based methods”. Worobiec A, Stefaniak EA, Kiro S, Oprya M, Bekshaev A, Spolnik Z, Potgieter-Vermaak SS, Ennan A, Van Grieken R, X-ray spectrometry 36, 328 (2007). http://doi.org/10.1002/XRS.979
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Current trends in the literature on X-ray emission spectrometry”. Van Grieken R, Markowicz A, Veny P, X-ray spectrometry 20, 271 (1991). http://doi.org/10.1002/XRS.1300200605
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Determination of barium, lanthanum, cerium and neodymium in lateritic materials by various energy-dispersive X-ray fluorescence techniques and neutron activation analysis”. Labrecque JJ, Beusen JM, Van Grieken RE, X-ray spectrometry 15, 13 (1986). http://doi.org/10.1002/XRS.1300150105
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Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
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Editorial : award for best X-Ray Spectrometry referee during 2011-2012”. Van Grieken R, X-ray spectrometry 42, 3 (2013). http://doi.org/10.1002/XRS.2428
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Editorial: Award for best XRS referee during 2007-2008”. Van Grieken R, X-ray spectrometry 37, 571 (2008). http://doi.org/10.1002/XRS.1107
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Editorial : introducing Dr Markowicz as X-Ray Spectrometry's new associate editor for Europe”. Van Grieken R, X-ray spectrometry 42, 175 (2013). http://doi.org/10.1002/XRS.2447
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EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials”. Belikov KN, Mikhailova LI, Spolnik ZM, Van Grieken R, X-ray spectrometry 35, 112 (2006). http://doi.org/10.1002/XRS.874
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EDXRS study of aerosol composition variations in air masses crossing the North Sea”. Injuk J, van Malderen H, Van Grieken R, Swietlicki E, Knox JM, Schofield R, X-ray spectrometry 22, 220 (1993). http://doi.org/10.1002/XRS.1300220410
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Efficiency calibartion of energy-dispersive detectors for application in quantitative x- and γ-ray spectrometry”. Szalóki I, Szegedi S, Varga K, Braun M, Osán J, Van Grieken R, X-ray spectrometry 30, 49 (2001). http://doi.org/10.1002/XRS.467
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Energy-dispersive X-ray fluorescence analysis of geological materials in borax beads using Tertian's binary coefficient approach combined with internal standard addition”. Muia LM, Van Grieken R, X-ray spectrometry 20, 179 (1991)
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Energy-dispersive X-ray fluorescence in geochemical mapping”. Civici N, Van Grieken R, X-ray spectrometry 26, 147 (1997). http://doi.org/10.1002/(SICI)1097-4539(199707)26:4<147::AID-XRS193>3.0.CO;2-X
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Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 131 (1986). http://doi.org/10.1002/XRS.1300150211
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Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles”. Osán J, de Hoog J, van Espen P, Szalóki I, Ro C-U, Van Grieken R, X-ray spectrometry 30, 419 (2001). http://doi.org/10.1002/XRS.523
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Folding of aerosol loaded filters during X-ray fluorescence analysis”. Van Grieken RE, Adams FC, X-ray spectrometry 5, 61 (1976). http://doi.org/10.1002/XRS.1300050204
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Grazing-exit electron probe x-ray microanalysis of light elements in particles”. Spolnik Z, Tsuji K, Van Grieken R, X-ray spectrometry 33, 16 (2004). http://doi.org/10.1002/XRS.656
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Heavy metal analysis around Iskenderun Bay in Turkey”. Čevik U, Koz B, Makarovska Y, X-ray spectrometry 39, 202 (2010). http://doi.org/10.1002/XRS.1250
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Heterogeneity effects in direct X-ray fluorescence analysis of hair”. Török S, Van Dyck P, Van Grieken R, X-ray spectrometry 13, 27 (1984). http://doi.org/10.1002/XRS.1300130106
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Heterogeneity effects in direct XRF analysis of traces of heavy metals preconcentrated on polyurethane foam sorbents”. Török S, Braun T, Van Dyck P, Van Grieken R, X-ray spectrometry 15, 7 (1986). http://doi.org/10.1002/XRS.1300150104
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High-energy polarized-beam EDXRF for trace metal analysis of vegetation samples in environmental studies”. Marguí, E, Padilla R, Hidalgo M, Queralt I, Van Grieken R, X-ray spectrometry 35, 169 (2006). http://doi.org/10.1002/XRS.890
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Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry”. van Malderen H, Hoornaert S, Injuk J, Przybylowicz WJ, Pineda CA, Prozesky VM, Van Grieken R, X-ray spectrometry 30, 320 (2001). http://doi.org/10.1002/XRS.505
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Influence of sample thickness, excitation energy and geometry on particle size effects in XRF”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 14, 183 (1985). http://doi.org/10.1002/XRS.1300140409
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Introducing four new members of the editorial board of X-ray spectrometry”. Van Grieken R, X-ray spectrometry 44, 1 (2015). http://doi.org/10.1002/XRS.2577
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