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Depth profiling of coated steel wires by GDMS”. van Straaten M, Butaye L, Gijbels R, , 629 (1992)
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Depth profiling of silver halide microcrystals”. Geuens I, Gijbels R, Jacob W, Verbeeck A, de Keyzer R, , 479 (1992)
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Evaluation of the laser microprobe with time-of-flight mass spectrometer for organic surface and micro-analysis”. van Roy W, van Vaeck L, Gijbels R, , 1959 (1992)
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High resolution electron microscopy for materials”. van Landuyt J Eurem 92, Granada, page 23 (1992).
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Identification des substances inorganiques et organiques en surface des solides par la microsonde laser”. van Vaeck L, Gijbels R Eyrolles, Paris, page 27 (1992).
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In situ HREM study of electron irradiation effects in AgCl microcrystals”. Goessens C, Schryvers D, de Keyzer R, van Landuyt J Eurem 92, Granada, page 646 (1992).
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Micro-structure of fullerites and high Tc superconductors”. Van Tendeloo G, Krekels T, Amelinckx S Granada, page 17 (1992).
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Microanalysis of individual silver halide microcrystals”. Wu S, van Daele A, Jacob W, Gijbels R, Verbeeck A, de Keyzer R, , 1612 (1992)
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Oxide superconductors: electron microscopy”. Mitchell TE, Gronsky R, Van Tendeloo G Pergamon Press, Oxford, page 401 (1992).
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Oxygen ordering and critical temperature plateaus in ABa2Cu3O7-d (A=Er, Nd, Sm, Yb), pp”. Zou H, Krekels T, Van Tendeloo G, Wagener G, Buchgeister M, Hosseini SM, Kopitzki K, , 278 (1992)
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The selective imaging of “substructures&rdquo, in the mixed layer compounds Ca0.85CuO2 and (Ca,Sr)14Cu24O41”. Amelinckx S, Milat O, Van Tendeloo G, , 240 (1992)
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Structural instabilities associated with phase transitions: an electron microscopy study”. Van Tendeloo G, Schryvers D, Tanner LE, , 107 (1992)
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Structure and phase transitions in C60 and C70 fullerites”. Van Tendeloo G, Muto S, van Heurck C, Amelinckx S, , 476 (1992)
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A temperature study of mixed AgBr-AgBrI tabular crystals”. Goessens C, Schryvers D, van Landuyt J, Geuens I, Gijbels R, Jacob W, de Keyzer R, , 36 (1992)
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Trace element geochemistry of the system rock-thermal water –, suspended matter –, deposits in a granitic environment”. Pentcheva EN, Veldeman E, Van 't dack L, Gijbels R, , 1321 (1992)
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens K, van Langevelde F, Adams F, Vis R, Sutton S, Rivers M, Jones K, Bowen D, (1992)
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Spectrum evaluation”. van Espen P, Janssens K (1992).
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Automated EPXMA of individual environmental particles”. Van Grieken R, Artaxo P, Xhoffer C, (1992)
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Characterization of individual environmental particles by beam techniques”. Xhoffer C, Wouters L, Artaxo P, van Put A, Van Grieken R page 107 (1992).
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Electron energy-loss spectroscopy and its application to individual particle analysis”. Xhoffer C, Jacob W, Van Grieken R, Broekaert JAC, Buseck P, (1992)
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Fluxes and sources of heavy metal inputs into the Southern Bight of the North Sea”. Van Grieken R, Injuk J, Otten P, Rojas C, van Malderen H, Laane R page 184 (1992).
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Individual particle analysis of sediments from the Gulf of Lions, suspensions from the Rhône river and dust of Saharan origin: preliminary results”. Wegrzynek D, Eisma D, Van Grieken R, (1992)
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Modern micro-analytical techniques for the elucidation of causes and mechanisms of material deterioration”. Van Grieken R, Dewolfs R, (1992)
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Prediction of Mα/L&alpha, intensity ratios and the use in the spectra evaluation”. Trincavelli J, Montoro S, Van Grieken R, van Espen P, (1992)
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AM, Van Grieken RE page 339 (1992).
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Sample preparation for XRF”. Injuk J, Van Grieken RE page 657 (1992).
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Weathering of bare and treated limestones under ambient conditions using runoff water analysis and microanalysis”. Vleugels G, Van Grieken R, (1992)
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The incommensurate structure of (Sr, Ca)14Cu24O41: a study by electron diffraction and high-resolution microscopy”. Milat O, Van Tendeloo G, Amelinckx S, Mehbod M, Deltour R, Acta crystallographica A48, 618 (1992). http://doi.org/10.1107/S0108767392002204
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis”. Janssens KH, Adams FC, van Langevelde F, Vis RD, Jones KW, Rivers M, Sutton S, Advances in X-ray analysis 35, 1265 (1992)
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Laser ionization mass-spectrometry for the characterization of solid materials”. van Vaeck L, Vanroy W, Gijbels R, Analusis : chimie analytique, méthodes physiques d'analyse, composition de la matière 20, S29 (1992)
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