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| Author | Hoornaert, S.; Treiger, B.; Valkovic, V.; Van Grieken, R. | ||||
| Title | Electron probe X-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level | Type | A1 Journal article | ||
| Year | 1998 | Publication | Microchimica acta | Abbreviated Journal | |
| Volume | 128 | Issue | Pages | 207-213 | |
| Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
| Abstract | |||||
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| Corporate Author | Thesis | ||||
| Publisher | Place of Publication  |
Editor | |||
| Language | Wos | 000071438000010 | Publication Date | 2005-02-26 | |
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 0026-3672; 1436-5073 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | no | |||
| Call Number | UA @ admin @ c:irua:20960 | Serial | 7873 | ||
| Permanent link to this record | |||||