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| Record | |||||
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| Author | Stuer, G.; Bender, H.; van Landuyt, J.; Eyben, P. | ||||
| Title | Stress analysis with convergent beam electron diffraction around NMOS transistors | Type | P1 Proceeding | ||
| Year | 2001 | Publication | Abbreviated Journal | ||
| Volume | Issue | Pages | 359-360 | ||
| Keywords | P1 Proceeding; Electron microscopy for materials research (EMAT); Internet Data Lab (IDLab) | ||||
| Abstract | |||||
| Address | |||||
| Corporate Author | Thesis | ||||
| Publisher | Princeton University Press | Place of Publication | Princeton, N.J. | Editor | |
Language  |
Wos | Publication Date | 0000-00-00 | ||
| Series Editor | Series Title | Abbreviated Series Title | |||
| Series Volume | Series Issue | Edition | |||
| ISSN | 1-58949-003-7 | ISBN | Additional Links | UA library record; WoS full record; | |
| Impact Factor | Times cited | Open Access | |||
| Notes | Approved | Most recent IF: NA | |||
| Call Number | UA @ lucian @ c:irua:95736 | Serial | 3176 | ||
| Permanent link to this record | |||||