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Classification of suspended particles in deposition samples and run-off water samples from a limestone cathedral”. Leysen LA, Roekens EJ, Storms H, Van Grieken RE, Atmospheric environment 21, 2425 (1987). http://doi.org/10.1016/0004-6981(87)90377-5
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Rates of air pollution induced surface recession and material loss for a cathedral in Belgium”. Roekens E, Van Grieken R, Atmospheric environment 23, 271 (1989). http://doi.org/10.1016/0004-6981(89)90119-4
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Aerosols in Santiago de Chile : a study using receptor modeling with X-ray fluorescence and single particle analysis”. Rojas CM, Artaxo P, Van Grieken R, Atmospheric environment: part B : urban atmosphere 24, 227 (1990). http://doi.org/10.1016/0957-1272(90)90028-S
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Folding of aerosol loaded filters during X-ray fluorescence analysis”. Van Grieken RE, Adams FC, X-ray spectrometry 5, 61 (1976). http://doi.org/10.1002/XRS.1300050204
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Trace analysis of estuarine brown algae by energy-dispersive X-ray fluorescence”. Sauter L, Van der Ben D, Van Grieken R, X-ray spectrometry 8, 159 (1979). http://doi.org/10.1002/XRS.1300080405
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Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis”. Markowicz A, Van Dyck P, Van Grieken R, X-ray spectrometry 9, 52 (1980). http://doi.org/10.1002/XRS.1300090205
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Automatic absorption correction in x-ray fluorescence analysis of intermediate thickness samples using a dual external reference signal”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 9, 70 (1980). http://doi.org/10.1002/XRS.1300090209
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Automated matrix-correction of line ratios in energy-dispersive x-ray fluorescence spectrum deconvolution”. Van Dyck P, Van Grieken R, X-ray spectrometry 12, 111 (1983). http://doi.org/10.1002/XRS.1300120306
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Heterogeneity effects in direct X-ray fluorescence analysis of hair”. Török S, Van Dyck P, Van Grieken R, X-ray spectrometry 13, 27 (1984). http://doi.org/10.1002/XRS.1300130106
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Influence of sample thickness, excitation energy and geometry on particle size effects in XRF”. Van Dyck P, Markowicz A, Van Grieken R, X-ray spectrometry 14, 183 (1985). http://doi.org/10.1002/XRS.1300140409
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Determination of barium, lanthanum, cerium and neodymium in lateritic materials by various energy-dispersive X-ray fluorescence techniques and neutron activation analysis”. Labrecque JJ, Beusen JM, Van Grieken RE, X-ray spectrometry 15, 13 (1986). http://doi.org/10.1002/XRS.1300150105
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Heterogeneity effects in direct XRF analysis of traces of heavy metals preconcentrated on polyurethane foam sorbents”. Török S, Braun T, Van Dyck P, Van Grieken R, X-ray spectrometry 15, 7 (1986). http://doi.org/10.1002/XRS.1300150104
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Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles”. Storms HM, Janssens KH, Török SB, Van Grieken RE, X-ray spectrometry 18, 45 (1989). http://doi.org/10.1002/XRS.1300180203
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Theoretical evaluation of the effective alpha and De Jongh approaches in X-ray fluorescence analysis of geological materials in borax glass beads”. Muia LM, Van Grieken R, X-ray spectrometry 18, 259 (1989). http://doi.org/10.1002/XRS.1300180604
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Determination of sample thickness via scattered radiation in X-ray fluorescence spectrometry with filtered continuum excitation”. Araujo MF, van Espen P, Van Grieken R, X-ray spectrometry 19, 29 (1990). http://doi.org/10.1002/XRS.1300190107
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Use of theoretical accurate binary influence coefficients with Tertian's equation in X-ray fluorescence analysis of silicate rocks in borax glass beads”. Muia LM, Van Grieken R, X-ray spectrometry 19, 141 (1990). http://doi.org/10.1002/XRS.1300190311
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Materiaaltransfer van de oceaan naar de atmosfeer”. Van Grieken R, Mededelingen en informatie , 15 (1976)
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Background aerosol composition at Gobabeb, South West Africa”. Annegarn H, Van Grieken R, van Espen P, von Blottnitz F, Sellschop J, Winchester J, Maenhaut W, Madoqua , 107 (1976)
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Enrichment of trace metals in water by adsorption on activated carbon”. Vanderborght BM, Van Grieken RE, Analytical chemistry 49, 311 (1977)
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Sub-part-per-billion determination of total dissolved selenium and selenite in environmental waters by X-ray fluorescence spectrometry”. Robberecht HJ, Van Grieken RE, Analytical chemistry 52, 449 (1980). http://doi.org/10.1021/AC50053A017
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Characterization of a 2,2'-diaminodiethylamine-cellulose filter toward metal cation extraction”. Smits JA, Van Grieken RE, Analytical chemistry 52, 1479 (1980). http://doi.org/10.1021/AC50059A022
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Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable composition and thickness”. Van Dyck PM, Van Grieken RE, Analytical chemistry 52, 1859 (1980). http://doi.org/10.1021/AC50062A020
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Laser microprobe mass spectrometry : 1 : basic principles and performance characteristics”. Denoyer E, Van Grieken R, Adams F, Ntausch DFS, Analytical chemistry 54, 26a (1982). http://doi.org/10.1021/AC00238A722
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Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
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Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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Embedded ion exchange beads as standards for laser microprobe mass analysis of biological specimens”. Verbueken AH, Van Grieken RE, Paulus GJ, De Bruijn WC, Analytical chemistry 56, 1362 (1984). http://doi.org/10.1021/AC00272A036
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Laser microprobe mass spectrometric identification of sulfur species in single micrometer-size particles”. Bruynseels FJ, Van Grieken RE, Analytical chemistry 56, 871 (1984). http://doi.org/10.1021/AC00270A004
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Enhancement effect in X-ray fluorescence analysis of environmental samples of medium thickness”. Van Dyck PM, Török SB, Van Grieken RE, Analytical chemistry 58, 1761 (1986). http://doi.org/10.1021/AC00121A036
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
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Absorption correction in electron probe x-ray microanalysis of thin samples”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 58, 1282 (1986). http://doi.org/10.1021/AC00298A003
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