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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links  |
Links |
|
|
Stuer, C.; van Landuyt, J.; Bender, H.; Rooyackers, R.; Badenes, G. |
The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures |
2001 |
Materials science in semiconductor processing |
4 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Bernaerts, D.; Van Tendeloo, G.; Amelinckx, S.; Hevesi, K.; Gensterblum, G.; Yu, L.M.; Pireaux, J.J.; Grey, F.; Bohr, J. |
Structural defects and epitaxial rotation of C60 and C70 (111) films on GeS(001) |
1996 |
Journal of applied physics |
80 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Pachoud, E.; Bréard, Y.; Martin, C.; Maignan, A.; Abakumov, A.M.; Suard, E.; Smith, R.I.; Suchomel, M.R. |
Bi0.75Sr0.25FeO3-\delta : revealing order/disorder phenomena by combining diffraction techniques |
2012 |
Solid state communications |
152 |
6 |
UA library record; WoS full record; WoS citing articles |
|
|
|
Riva, C.; Peeters, F.M.; Varga, K.; Schweigert, V.A. |
Correlation energy and configuration of biexcitons in quantum wells |
2002 |
Physica status solidi: B: basic research |
234 |
6 |
UA library record; WoS full record; WoS citing articles |
|
